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NASA Scientific and Technical Aerospace Reports

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electrons up to 2 MeV, floating potentials to 12 kV have been measured, with breakdown <strong>and</strong> breakdown recovery detected.<br />

Various laboratory measurement examples will be presented.<br />

Author<br />

Electrostatic Probes; Monitors; Electric Charge; Dielectrics; Electrical Faults; Floating; Embedding; Piezoelectric Motors<br />

20040111113<br />

Degradation of High Voltage Solar Array Due to Arching in LEO Plasma Environment<br />

Okumura, Teppei; Hosoda, Satoshi; Toyoda, Kazuhiro; Cho, Mengu; 8th Spacecraft Charging Technology Conference; March<br />

2004; 13 pp.; In English; See also 20040111031; No Copyright; Avail: CASI; A03, Hardcopy<br />

A degradation test for a solar array coupon against ESD was performed under simulated Low Earth Orbit environment.<br />

All tests were performed in a vacuum chamber with a plasma source. A test coupon was biased at -400V with the aim of<br />

developing the next generation 400V high voltage solar array. The LCR circuit was used in order to simulate the arc current<br />

that flows by gathering the charge stored on coverglasses. Tests were repeated until the solar array coupon was damaged. The<br />

arc locations <strong>and</strong> waveforms of both current <strong>and</strong> voltage were detected for all the arcs during the tests. The electrical<br />

performance of the coupon was measured after every test without opening the vacuum chamber. Many arcs occurred <strong>and</strong><br />

caused the cell degradation. The cell was damaged by only one arc that occurred at the edge of cell, not at electrodes.<br />

Author<br />

Degradation; Solar Arrays; Low Earth Orbits; Earth Orbital Environments; Performance Tests; Electrical Properties; High<br />

Voltages<br />

20040111140 Lockheed Martin Corp., Syracuse, NY, USA<br />

Generation of Compositionally Graded Ga(1-x)In(x)Sb Seed by Solute Diffusion<br />

Dutta, P. S.; Rajagopalan, G.; Gutmann, R. J.; Nichols, G.; Aug. 2002; 16 pp.; In English<br />

Report No.(s): DE2004-821859; LM-02K070; No Copyright; Avail: Department of Energy Information Bridge<br />

Compositionally graded single crystalline seed of Ga(sub 1-x)In(sub x)Sb has been grown in a single experiment<br />

using a solute diffusion method. The present technique is simple <strong>and</strong> less time consuming compared to the conventional<br />

boot-strapping approach previously used for generating ternary seeds. Starting from an InSb single crystalline seed, a<br />

seed of Ga(sub 0.6)In(sub 0.4)Sb has been grown. The effect of temperature gradient on the crystalline quality of seeds grown<br />

using this method has been discussed.<br />

NTIS<br />

Crystal Growth; Single Crystals; Temperature Effects; Crystallinity<br />

20040111193 Building <strong>and</strong> Construction Research TNO, Delft, Netherl<strong>and</strong>s<br />

Power Management<br />

vanVugt, J.; August 28, 2003; 62 pp.; In English<br />

Contract(s)/Grant(s): A99/KM/140/13630; TNO Proj. 006.28131/01.01<br />

Report No.(s): Rept-2002-CMC-R013; Copyright; Avail: Other Sources<br />

This report describes a power management simulation tool for electrical installations in an all-electric ship under various<br />

conditions like component failure, electric faults or physical damage. The simulation programme PROGRESS does the<br />

simulation of the damage. The programme General Energy Systems (GES) simulates the electrical installation <strong>and</strong> the power<br />

management controller. Both programs have been developed by TNO for the Royal Netherl<strong>and</strong>s Navy. For this project an<br />

interface has been written for exchange of data between the programs.<br />

Author<br />

Ships; Computerized Simulation; Installing; Electric Power; Power; Control Equipment<br />

20040111450 Strategic Analysis, Inc., San Clemente, CA<br />

Introduction - MEMS <strong>Aerospace</strong> Applications<br />

Schadow, Klaus C.; Feb. 2004; 28 pp.; In English; Original contains color illustrations<br />

Report No.(s): AD-A425326; No Copyright; Avail: CASI; A03, Hardcopy<br />

No abstract available<br />

<strong>Aerospace</strong> Engineering; Microelectromechanical Systems<br />

99

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