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Thixoforming : Semi-solid Metal Processing

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Table 8.4 Deposition parameters for the multilayer system W–ZrO2.<br />

Process parameters Etching phase Interlayer tungsten Top layer ZrO2<br />

Process pressure (Pa) 1 0.5 0.3–1<br />

Process time (s) 1800 3600 7200<br />

R.f. power (W) 100 — —<br />

R.f. frequency (MHz) 13.56 — —<br />

N 2,O 2 concentration (%) — — 2–16<br />

Pulse parameters<br />

Pulse mode/pulse power (W) — DC/400 Unipolar/500<br />

Pulse sequence (ton–/toff–) (ms) — 5/25 3.56/2.67<br />

M.f. (kHz) — 0 33<br />

Pulse voltage (V) — Power controlled 980–1022<br />

Pulse current (A) — — 0.5<br />

Table 8.5 Properties of four representative coatings.<br />

Property<br />

<strong>Metal</strong>lic<br />

ZrO2<br />

8.4 Multifunctional PVD Composites for <strong>Thixoforming</strong> Mouldsj261<br />

Monoclinic<br />

ZrO2<br />

Tetragonal þ monoclinic<br />

ZrO2<br />

Tetragonal<br />

ZrO2<br />

Depositing pressure (Pa) 1 1 0.5 0.3<br />

Coating thickness (mm) 9.9 3.8 8.3 6<br />

O2 (sccm) 1.76 3.96 2.07 1.7<br />

O 2/Ar (%) 2 2 5 7<br />

Phase composition <strong>Metal</strong>lic Monoclinic Tetragonal þ monoclinic Tetragonal<br />

To study the effect of the different crystalline phase on the properties of the films,<br />

four characteristic samples were selected. By changing the O 2 to argon ratio, a drop in<br />

the deposition rate in nanometres per minute can be observed. The effect of the<br />

oxygen flow rate on the coating thickness is shown in Figure 8.18 This behaviour can<br />

be explained by the hysteresis effect of the deposition process [33]. With increasing<br />

oxygen flow rate, the coating structure changed from metallic to crystalline and finally<br />

to amorphous (Figure 8.19). The phase composition of the deposited samples was<br />

determined using XRD as described previously. By changing the oxygen to argon<br />

ratio, the experiments revealed that with a deposition pressure of 1 and 0.5 Pa only a<br />

small amount of tetragonal phase can be deposited. For the coating, the development<br />

of t-ZrO2 coatings with very small crystallite sizes is needed to stabilize this phase [34].<br />

Calculations using the Debye–Scherer equitation show that the domain size for the<br />

t-ZrO2 coatings is in the range 4–5nm.<br />

Figure 8.19 shows the cross-sections of the investigated samples. The cross-section<br />

show in Figure 8.19c indicates a very fine-grained morphology for the tetragonal<br />

phase compared with the other three SEM images.

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