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Thixoforming : Semi-solid Metal Processing

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72j 3 Material Aspects of Steel <strong>Thixoforming</strong><br />

Figure 3.20 Structures and determined liquid-phase contents of<br />

quenched samples above the three-phase area, where fine,<br />

secondary austenite is highlighted by the arrows.<br />

globulites become increasingly smaller, which makes the differentiation more<br />

complicated.<br />

Due to the large difference (>20 vol.%) between the metallographically determined<br />

and the DTA and Thermo-Calc designated phase contents, it has to be assumed that<br />

in addition to the described local, irregular increase in secondary austenite, a smooth<br />

globulite growth occurs in all directions in space. This mechanism is more pronounced<br />

at higher temperatures, so that it cannot be neglected as with lower liquidphase<br />

contents. An examination of the differently formed austenite is impossible by<br />

means of conventional metallography.<br />

Because conventional examination methods meet their limits for materials with<br />

fine, low-contrast structures, where a differentiation by means of grey-scale areas is<br />

impossible, texture analysis and analysis of the element distribution provide methods<br />

to solve many problems [62]. Therefore, microprobe examinations and EBSD<br />

(Electron Beam Scattering Detection) measurements were executed to achieve a<br />

differentiation of primary austenite and regularly growing secondary austenite.<br />

3.4.1.3 Microprobe Examinations of the Quenched X210CrW12 Specimens<br />

In addition to the metallographic examination, two samples quenched from 1290 and<br />

1330 C were examined with a microprobe to differentiate between primary and<br />

secondary austenite by means of element distribution. X-ray intensity distribution<br />

images with a step range of 2 mm show that the austenite grains for these two<br />

temperatures exhibit nearly identical element content intensities (Figure 3.20). In<br />

Figure 3.21, the intensities of the elements Si, W, Cr and C are displayed. The<br />

examination shows that no gradients giving information about the former phase

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