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Thixoforming : Semi-solid Metal Processing

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Figure 3.21 Element-distribution images (Si, W, Cr, C) of<br />

dimensions 500 500 mm of specimens quenched from 1290 C<br />

(a) and 1330 C (b) of the material X210CrW12. Markings of the<br />

line-scan distances are displayed in Figure 3.23.<br />

boundaries could be measured in the element distribution. The measurements prove<br />

the already determined, by means of calculation, accumulation of chromium,<br />

tungsten and carbon and the depletion of silicon in the eutectic. The element<br />

distribution images in Figure 3.22 also show constant alloying element contents in<br />

the austenite for a continuous measurement, where no significant difference<br />

between the primary grain and the accumulated secondary grain can be seen.<br />

The associated line-scan measurements for specimens quenched from 1290 C<br />

exhibit an erratic change of the carbon and tungsten content around the phase<br />

Figure 3.22 Element-distribution images (Si, W, Cr, C) of<br />

dimensions 60 60 mm of specimens quenched from 1290 C<br />

(a) and 1330 C (b) of the material X210CrW12. The secondary<br />

austenite probably accumulated during quenching is identified<br />

with arrows.<br />

3.4 Structural Parameter Development and Material Selectionj73

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