30.01.2013 Views

Thixoforming : Semi-solid Metal Processing

Thixoforming : Semi-solid Metal Processing

Thixoforming : Semi-solid Metal Processing

SHOW MORE
SHOW LESS

You also want an ePaper? Increase the reach of your titles

YUMPU automatically turns print PDFs into web optimized ePapers that Google loves.

272j 8 Tool Technologies for Forming of <strong>Semi</strong>-<strong>solid</strong> <strong>Metal</strong>s<br />

Table 8.9 Experimental conditions during the deposition<br />

experiments: peak voltage (VP), deposition temperature (Ts),<br />

pressure, precursors ratio (P R) and precursor content (P C).<br />

Set of experiments 1:<br />

variation of VP and Ts<br />

Set of experiments 2:<br />

variation of Pc<br />

Set of experiments 3:<br />

variation of PR and Ts<br />

coated sample at temperatures of 1170 30 C for 5 s. The sample was then cooled<br />

under an air stream for 15 s. This procedure was repeated 1000 times. After this<br />

treatment, a cross-section of the sample was evaluated by SEM and EDS.<br />

8.5.2<br />

Results and Discussion<br />

Peak<br />

voltage (V)<br />

Temperature<br />

( C)<br />

Pressure<br />

(Pa)<br />

AlCl 3/O 2<br />

ratio<br />

720 to 905 500–600 175 1 2<br />

AlCl 3 þ O 2<br />

content (%)<br />

900 600 175 1.15 0.8–5.3<br />

900 540–600 175 0.5–1.15 2–3.45<br />

8.5.2.1 Chemical Composition and Constitution<br />

The influence of the power density (PD) on the films constitution was studied by<br />

varying the peak voltage from 720 to 905 V (set of experiments 1, Table 8.9). P D<br />

was calculated by multiplying the measured current by the voltage, which was then<br />

normalized with respect to the cathode surface area. The influence of PD on the<br />

chemical composition of the films was evaluated by EDS. No dependence of the Al/O<br />

ratio which was measured to be 0.59 0.02 at.% was observed. Nevertheless, it was<br />

found that all films contain chlorine at levels from 0.9 0.01 to 2.3 0.01 at.%<br />

depending on their constitution. This will be discussed later. The phase-formation<br />

data from 12 experiments were compiled into one diagram correlating TS and PD with<br />

the film constitution (Figure 8.28).<br />

The data in the diagram can be grouped into three regions according to the<br />

constitution of the films, namely region I, phase pure g-alumina; region II, mixture of<br />

g- and a-alumina; and region III, phase pure a-alumina. In this diagram, it is clearly<br />

observed that, on increasing the energy supplied to the growing films (thermal or<br />

through particle bombardment), a-alumina is preferentially grown. It is important to<br />

note that by increasing PD to 6.6 Wcm 2 and TS at about 560 C it is possible to grow<br />

phase pure a-alumina.<br />

According to theory, the mobility and dwell time of adsorbed particles on the<br />

surface are important for the film constitution. These parameters are mainly<br />

controlled by the energy provided to the growing film. In PECVD processes, this<br />

energy can be provided not only thermally by substrate heating as in conventional<br />

CVD processes, but also by collision of adsorbed particles with the ions bombarding<br />

the surface. Due to the latter phenomena, the adsorbed particles received additional<br />

energy which led to higher mobility and therefore to modification of the film

Hooray! Your file is uploaded and ready to be published.

Saved successfully!

Ooh no, something went wrong!