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ing active couplers, Trans. IECE Japan EA77-40,9–14<br />

(1977)<br />

24.20 G.S.K. Wong, T.F.W. Emble<strong>to</strong>n: Arrangement for<br />

precision reciprocity calibration of condenser microphones,<br />

J. Acoust. Soc. Am. 66(5), 1275–1280<br />

(1979)<br />

24.21 V. Nedzelnitsky, E. D. Burnett, W. B. Penzes: Calibration<br />

of labora<strong>to</strong>ry condenser microphones.<br />

In: Proc. 10th Transducer Workshop, Transducer<br />

Committee, Telemetry Group, Range Commanders<br />

Council (DTIC, Colorado Springs 1979)<br />

24.22 A. Suzuki, S. Yoshikawa: On the estimated error<br />

for pressure calibration of standard condenser microphones,<br />

Electr. Commun. Lab. J. (Jpn) 29(7),<br />

1251–1262 (1980)<br />

24.23 D.L.H. Gibbings, A.V. Gibson: Contributions <strong>to</strong> the<br />

reciprocity calibration of microphones, Metrologia<br />

17, 7–15 (1981)<br />

24.24 T. Takahashi, H. Miura: Corrections for the<br />

reciprocity calibration of labora<strong>to</strong>ry standard condenser<br />

microphones, Bull. Electrotech. Lab. (Jpn)<br />

46(3-4), 78–81 (1982)<br />

24.25 M.E. Delany, E.N. Bazley: Uncertainties in Realizing<br />

the Standard of Sound Pressure by Closed-Coupler<br />

Reciprocity Technique, Acoust. Rep. 99 (National<br />

Physical Labora<strong>to</strong>ry, Tedding<strong>to</strong>n 1980), (see also<br />

2nd ed. 1982)<br />

24.26 D.L.H. Gibbings, A.V. Gibson: Wide-band calibration<br />

of capaci<strong>to</strong>r microphones, Metrologia 20,<br />

95–99 (1984)<br />

24.27 L. L. Beranek: Acoustical Measurements (Acoust.<br />

Soc. Am./AIP, Melville 1988), (4, 133-134)<br />

24.28 K.O. Ballagh, A.C. Corney: Some developments<br />

in au<strong>to</strong>mated microphone reciprocity calibration,<br />

Acustica 71, 200–209 (1990)<br />

24.29 G. S. K. Wong, T. F. W. Emble<strong>to</strong>n: AIP Handbook of<br />

Condenser Microphones. Theory, Calibration, and<br />

Measurements (American Institute of Physics, New<br />

York 1995)<br />

24.30 N.H. Fletcher, S. Thwaites: Electrode surface profile<br />

and the performance of condenser microphones,<br />

J. Acoust. Soc. Am. 112(6), 2779–2785 (2002)<br />

24.31 BIPM: Guide <strong>to</strong> the Expression of Uncertainties in<br />

Measurement (BIPM, Paris 1995)<br />

24.32 G.S.K. Wong: Precise measurement of phase difference<br />

and amplitude ratio of two coherent<br />

sinusoidal signals, J. Acoust. Soc. Am. 75(3), 967–<br />

972 (1984)<br />

24.33 B. Daniels: Acoustic impedance of enclosures, J.<br />

Acoust. Soc. Am. 19, 569–571 (1947)<br />

24.34 F. Biagi, R.K. Cook: Acoustic impedance of a right<br />

circular cylindrical enclosure, J. Acoust. Soc. Am.<br />

26, 506–509 (1954)<br />

24.35 H. Gerber: Acoustic properties of fluid-filled chambers<br />

at infrasonic frequencies in the absence of<br />

convection, J. Acoust. Soc. Am. 36, 1427–1434 (1964)<br />

24.36 K.O. Ballagh: Acoustical admittance of cylindrical<br />

cavities, J. Sound Vibrat. 112(3), 567–569 (1987)<br />

Microphones and Their Calibration References 1049<br />

24.37 D.R. Jarvis: Acoustical admittance of cylindrical<br />

cavities, J. Sound Vibrat. 117(2), 390–392 (1987)<br />

24.38 ANSI: ANSI S1.15 – 2005. American National Standard<br />

Measurement Microphones – Part 2: Primary<br />

Method for Pressure Calibration of Labora<strong>to</strong>ry Standard<br />

Microphones by Reciprocity Technique, (NIST,<br />

Gaithersburg 2005)<br />

24.39 T. Salava: Measurement of the Acoustic Impedance<br />

of Standard Labora<strong>to</strong>ry Microphones, The <strong>Acoustics</strong><br />

Labora<strong>to</strong>ry, Report, Vol. 18 (Technical University of<br />

Denmark, Lyngby 1976)<br />

24.40 IEC: IEC 61094-2:1992-03 Measurement Microphones<br />

- Part 2: Primary Method for Pressure<br />

Calibration of Labora<strong>to</strong>ry Standard Microphones by<br />

the Reciprocity Technique (IEC, Geneva 1992)<br />

24.41 ANSI S1.15-1997/Part 1 (R2001) American National<br />

Standard Measurement Microphones – Part 1:<br />

Specifications for Labora<strong>to</strong>ry Standard Microphones.<br />

See also: IEC International Standard<br />

61094-1 1992-05: Measurement Microphones Part 1:<br />

Specifications for Labora<strong>to</strong>ry Standard Microphones<br />

(NIST, Gaithersburg 1997)<br />

24.42 K. Rasmussen: Acoustical behaviour of cylindrical<br />

couplers, The <strong>Acoustics</strong> Labora<strong>to</strong>ry Report, Vol. 1<br />

(Technical University of Denmark, Lyngby 1969)<br />

24.43 H. Miura, E. Matsui: On the analysis of the wave<br />

motion in a coupler for the pressure calibration of<br />

labora<strong>to</strong>ry standard microphones, J. Acoust. Soc.<br />

Jpn. 30, 639–646 (1974)<br />

24.44 F. Jacobsen: An improvement of the 20 cm 3 coupler<br />

for reciprocity calibration of microphones, Acustica<br />

38, 151–153 (1977)<br />

24.45 G.S.K. Wong, L. Wu: Controlled environment for<br />

reciprocity calibration of labora<strong>to</strong>ry standard<br />

microphone and measurement of sensitivity pressure<br />

correction, Metrologia 36, 275–280 (1999)<br />

24.46 L. Wu, G.S.K. Wong, P. Hanes, W. Ohm: Measurement<br />

of sensitivity level pressure corrections for<br />

LS2P labora<strong>to</strong>ry standard microphones, Metrologia<br />

42, 45–48 (2005)<br />

24.47 K. Rasmussen: The Influence of Environmental Conditions<br />

on the Pressure Sensitivity of Measurement<br />

Microphones, Brüel Kjær Tech. Rev. 1 (Brüel Kjær,<br />

Nœrum 2001)<br />

24.48 G.S.K. Wong, L. Wu: Controlled environment for<br />

reciprocity callibration of labora<strong>to</strong>ry standard<br />

miccrophones and measurement of sensitivity<br />

pressure correction, Metrologica 36, 275–280 (1999)<br />

24.49 K. Rasmussen: The static pressure and temperature<br />

coefficients of labora<strong>to</strong>ry standard microphones,<br />

Metrologia 36(4), 265–273 (1999)<br />

24.50 G.S.K. Wong: Primary pressure calibration by<br />

reciprocity. In: AIP Handbook of Condenser Microphones.<br />

Theory, Calibration, and Measurements,<br />

Chap.4, ed. by G.S.K. Wong, T.F.W. Emble<strong>to</strong>n.<br />

(American Institute of Physics, New York 1995) p. 99<br />

24.51 V. Nedzelnitsky: Primary method for calibrating<br />

free-field response. In: AIP Handbook of Condenser<br />

Part H 24

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