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10. Appendix

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A4.1 A Prototypical Deep Center in N-Type Zincblende-Type Semiconductors 685<br />

[Lang74] D. V. Lang: Deep-level transient spectroscopy: a new method to characterize<br />

traps in semiconductors. J. Appl. Phys., 45, 3023–3032 (1974).<br />

[Lang79a] D. V. Lang, R. A. Logan and M. Jaros: Trapping characteristics and a donorcomplex<br />

(DX) model for the persistent-photoconductivity trapping center in Te-doped<br />

AlxGa1xAs. Phys. Rev. B19, 1015 (1979).<br />

[Lang79b] D. V. Lang, and R. A. Logan: Chemical shifts of DX centers in AlxGa1xAs.<br />

Physics of Semiconductors 1978 (Inst. Phys. Conf. Ser. No. 43, 1979) p. 433–436.<br />

[Lang85] D. V. Lang: DX centers in III-V alloys, in Deep Centers in Semiconductors, ed.<br />

by S. T. Pantelides (Gordon and Breach, New York, 1985) p. 489–539.<br />

[Li87] M. F. Li, P. Y. Yu, E. R. Weber and W. L. Hansen: Photocapacitance Study of<br />

Pressure-induced deep donors in GaAs:Si. Phys. Rev. B36, 4531 (1987).<br />

[Li94] M. F. Li: Modern Semiconductor Quantum Physics, (World Scientific, Singapore,<br />

1994 ), p.280-286.<br />

[Lifshitz80] N. Lifshitz, A. Jayaraman and R. A. Logan, and H. C. Card. Pressure and<br />

compositional dependences of the Hall coefficient in AlxGa1xAs and their significance.<br />

Phys. Rev. B21, 670–678 (1980).<br />

[Mizuta85] M. Mizuta, M. Tachikawa, H. Kukimoto and S. Minomura: Direct evidence<br />

for the DX center being a substitutional donor in AlGaAs alloy system. Jpn. J. Appl.<br />

Phys. 24, L143–L146 (1985).<br />

[Mooney88] P. M. Mooney, T. N. Theis and S. L. Wright: Effect of local alloy disorder on<br />

emission kinetics of deep donors (DX centers) in AlxGa1xAs of low Al content. Appl.<br />

Phys. Lett., 53, 2546–2548 (1988).<br />

[Mooney90] P. M. Mooney: Deep donor levels (DX centers) in III-V semiconductors, J.<br />

Appl. Phys. 67, R1 (1990).<br />

[Paul61] W. Paul. Band Structure of the Intermetallic Semiconductors from Pressure Experiments.<br />

J. Appl. Phys. Suppl. 32, 2082 (1961).<br />

[Sah75] C. T. Sah: Bulk and interface imperfections in semiconductors. Solid State Electronics,<br />

19, 975–990 (1976).<br />

[Shan89] W. Shan, P. Y. Yu, M. F. Li, W. L. Hansen and E. Bauser: Pressure Dependence<br />

of the DX Center in Ga1xAlxAs:Te. Phys. Rev. B40, 7831 (1989).<br />

[Suski94] For discussions on experimental results see, for example, T. Suski: Hydrostatic<br />

pressure investigations of metastable defect states. Defects in Semiconductors 17, Materials<br />

Science Forum, 143–147 (Trans Tech Pub., Switzerland, 1994) p. 975–982.<br />

[Wang89a] Shyh Wang: Fundamentals of Semiconductor Theory and Device Physics<br />

(Prentice Hall, New Jersey, 89] Chapter 8.<br />

[Wang89b] Shyh Wang: Fundamentals of Semiconductor Theory and Device Physics<br />

(Prentice Hall, New Jersey, 89] Section 9.7.<br />

[Wolk92] See, for example, J. A. Wolk, W. Walukiewicz, M. L. Thewalt and E. E. Haller:<br />

Formation of a DX center in InP under hydrostatic pressure. Phys. Rev. Lett. 68, 3619–<br />

3622 (1992) for a description of the infrared vibrational study.<br />

[Yamaguchi90] E. Yamaguchi, K. Shiraishi and T. Ohno: First principle calculation of the<br />

DX-center ground-states in GaAs, AlxGa1xAs alloys and AlAs/GaAs superlattices. J.<br />

Phys. Soc. Japan, 60, 3093–3107 (1991).<br />

[Zeman95] See J. Zeman, M. Zigone and G. Martinez: Optical investigation of the DX<br />

centers in GaAs under hydrostatic pressure. Phys. Rev. B51, 17551–17560 (1995) for a<br />

review of the Raman investigation of the DX center under pressure inside the DAC.

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