10. Appendix
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The Discovery and Very Basics of the Quantum Hall Effect 577<br />
Different approaches can be used to deduce a quantized value for the Hall<br />
resistance. The calculation shown in Fig. 9.39, which led to the discovery of the<br />
QHE, is simply based on the classical expression for the Hall effect. A quantized<br />
Hall resistance h/e 2 is obtained for a carrier density corresponding to the<br />
filling factor one. It is surprising that this simple calculation leads to the correct<br />
result. Laughlin was the first to try to deduce the result of the QHE in<br />
a more general way from gauge invariance principles [2]. However, his device<br />
geometry is rather removed from the real Hall effect devices with metallic<br />
contacts for the injection of the current and for the measurement of the electrochemical<br />
potential.<br />
The Landauer–Büttiker formalism, which discusses the resistance on the<br />
basis of transmission and reflection coefficients, is much more suitable for analyzing<br />
the quantum Hall effect [3]. This formalism was very successful in explaining<br />
the quantized resistance of ballistic point contacts [4] and, in a similar<br />
way, the quantized Hall resistance is the result of an ideal one-dimensional<br />
electronic transport. In a classical picture this corresponds to jumping orbits of<br />
electrons at the boundary of the device. In the future, the textbook explanation<br />
of the QHE will probably be based on this one-dimensional edge channel<br />
transport (see Fig. 9.40).<br />
References<br />
1 K. v. Klitzing, G. Dorda, M. Pepper: Phys. Rev. Lett. 45, 494 (1980)<br />
2 R.B. Laughlin: Phys. Rev. B 23, 5632 (1981)<br />
3 M. Büttiker: Phys. Rev. Lett. 57, 1761 (1986)<br />
4 B.J. von Wees, H. van Houten, S.W.J. Beenakker, J.G. Williamson, L.P. Kouwenhoven,<br />
D. van der Marel, C.T. Foxon: Phys. Rev. Lett. 60, 848 (1988);<br />
D.A. Wharam, T.J. Thornton, R. Newbury, M. Pepper, H. Ahmed, J.E.F. Frost, D.G.<br />
Hasko, D.C. Peacock, D.A. Ritchie, G.A.C. Jones: J. Phys. C 21, L 209 (1988)