10. Appendix
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768 Subject Index<br />
Pauli’s exclusion principle 20, 59<br />
PbI 2 3<br />
PbS 3, 569<br />
– dispersion of  r near edge 270<br />
– fundamental absorption edge 269–270<br />
PbTe 3<br />
Peak-to-valley current ratio in resonant tunneling<br />
devices 529<br />
Peierls transition 458<br />
Pekar additional boundary condition (ABC) 365<br />
Penn gap 336<br />
– table 337<br />
Percolation 544<br />
Periodic boundary conditions 27<br />
Perturbation theory<br />
– degenerate 68<br />
– nondegenerate 68<br />
Phase transition in QHE 543<br />
Phonon 109, 208<br />
– acoustic 110<br />
– creation and annihilation operators 125<br />
– dispersion curves 109, 110, 113<br />
– – AlAs 495<br />
– – ·-Sn 120<br />
– – CdS 117<br />
– – diamond 121<br />
– – GaAs 111, 495<br />
– – Si 111<br />
– dispersion relation in Si 2Ge 2 496<br />
– in polar SL’s 502<br />
– in tunneling devices 532<br />
– longitudinal 110<br />
– occupation number 126, 211, 382<br />
– optical 110, 300<br />
– quantization 109, 110<br />
– Raman spectra in semiconductors 388<br />
– Raman spectra in superlattices 519<br />
– sidebands in emission spectra 366<br />
– springs and balls models 109<br />
– transverse 110, 142<br />
– under uniaxial stress 426<br />
– velocity 210<br />
Phonon-polariton 292, 295–298<br />
Phosphine 6<br />
Phosphorus 2<br />
Photocathodes<br />
– efficiency 574<br />
– GaAs 432<br />
Photoconductive responce in semiconductor<br />
569<br />
Photoconductivity<br />
– extrinsic 312<br />
– intrinsic 312<br />
– phonon-assisted 311<br />
Photoelectron spectra 66<br />
– angle-integrated 440<br />
Photoelectron spectrometer (diagram) 435<br />
Photoelectron spectroscopy 427, 428, 429<br />
– angle-integrated 435<br />
– angle-resolved (ARPES) 435<br />
– diagram 434<br />
– origin of energy 437<br />
Photoemission 429, 431<br />
– direct-transitions scheme 449<br />
– indirect-transitions model 449<br />
– one-step model 439<br />
– surface preparation 437<br />
– three-step model 440, 446<br />
– threshold spectra of Si 434<br />
photoemission spectroscopy<br />
– UV 434<br />
– X-ray 434<br />
Photoexcitation spectra of group III acceptors in<br />
Si 570<br />
Photoluminescence 244, 345<br />
– determination of carrier temperature 354<br />
– from GaAs 353<br />
Photoluminescence excitation spectroscopy (PLE)<br />
369<br />
– correspondence with absorption spectra 370<br />
Photon counting electronics 387<br />
Photon energies 247<br />
Photon energy density 347<br />
Photon-assisted tunneling 325<br />
Photon-assisted photoconductivity 311<br />
Photon-exciton interaction 279<br />
Photon occupation number 346, 347<br />
Photon to polariton conversion 285<br />
Photons, zero-point motion 346<br />
Photoreflectance 329<br />
– of GaAs near E 0 331<br />
– of Ge with different isotopic masses 331<br />
Photothermal ionization spectroscopy (PTIS) 311<br />
– of ultrapure Ge 314<br />
– spectrum of P in Si 313<br />
Photothreshold energy 432, 438<br />
Piezoelectric effect 130<br />
Piezoelectric electron-phonon interaction 131, 213<br />
– in wurtzite semiconductors 156<br />
Piezoelectric field 131<br />
Piezoreflectance 321, 340<br />
– experimental setup 321<br />
– spectra of CdTe 322<br />
Pikus and Bir strain Hamiltonian 127, 147<br />
Planck distribution 422<br />
Planck’s radiation law 422<br />
Plasma 335<br />
– edge 310