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handbook of modern sensors

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186 5 Interface Electronic Circuits<br />

output analog voltage V c , which is an approximation <strong>of</strong> the input signal. This voltage<br />

is subtracted from the input signal and amplified by the amplifier to the value<br />

V D = (V m − V c )A. (5.36)<br />

The voltage V D is an amplified error between the actual and digitally represented<br />

input signals. For a full-scale input signal, the maximum error (V m − V c ) is equal to<br />

a resolution <strong>of</strong> an A/D converter; therefore, for an eight-bit conversion V D = 19.6A<br />

mV. The multiplexer connects that voltage to the A/D converter, which converts V D<br />

to a digital value C:<br />

C = V D<br />

R 0<br />

= (V m − V c ) A R 0<br />

. (5.37)<br />

As a result, the microprocessor combines two digital values: M and C, where C<br />

represents the high-resolution bits. If A = 255, then for the 5-V full-scale, LSB ≈<br />

77 µV, which corresponds to a total resolution <strong>of</strong> 16 bits. In practice, it is hard to<br />

achieve such a high resolution because <strong>of</strong> the errors originating in the D/A converter,<br />

reference voltage, amplifier’s drift, noise, and so forth. Nevertheless, the method is<br />

quite efficient when a modest resolution <strong>of</strong> 10 or 12 bits is deemed to be sufficient.<br />

5.5 Direct Digitization and Processing<br />

Most <strong>sensors</strong> produce low-level signals. To bring these signals to levels compatible<br />

with data processing devices, amplifiers are generally required. Unfortunately, amplifiers<br />

and connecting cables and wires may introduce additional errors, add cost to<br />

the instrument, and increase complexity. Some emerging trends in the sensor-based<br />

systems are causing use <strong>of</strong> the signal conditioning amplifiers to be reevaluated (at<br />

least for some transducers) [5]. In particular, many industrial sensor-fed systems are<br />

employing digital transmission and processing equipment. These trends point toward<br />

direct digitization <strong>of</strong> sensor outputs—a difficult task. It is especially true when a<br />

sensor-circuit integration on a single chip is considered.<br />

Classical A/D conversion techniques emphasize high-level input ranges. This<br />

allows the LSB step size to be as large as possible, minimizing <strong>of</strong>fset and noise error.<br />

For this reason, a minimum LSB signal is always selected to be at least 100–200 µV.<br />

Therefore, a direct connection <strong>of</strong> many <strong>sensors</strong> (e.g., RTD temperature transducers<br />

or piezoresistive strain gauges) is unrealistic. Such transducers’ full-scale output may<br />

be limited by several millivolts, meaning that a 10-bit A/D converter must have about<br />

1 µV LSB.<br />

Direct digitization <strong>of</strong> transducers eliminates a dc gain stage and may yield a<br />

better performance without sacrificing accuracy. The main idea behind direct digitization<br />

is to incorporate a sensor into a signal converter, (e.g., an A/D converter or an<br />

impedance-to-frequency converter). All such converters perform a modulation process<br />

and, therefore, are nonlinear devices. Hence, they have some kind <strong>of</strong> nonlinear<br />

circuit, <strong>of</strong>ten a threshold comparator. Shifting the threshold level, for instance, may<br />

modulate the output signal, which is a desirable effect.

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