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handbook of modern sensors

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464 16 Temperature Sensors<br />

Usually, RTDs are calibrated at standard points which can be reproduced in a<br />

laboratory with high accuracy (Table 16.1). Calibrating at these points allows for the<br />

precise determination <strong>of</strong> approximation constants α and δ.<br />

Typical tolerances for the wire-wound RTDs is ±10 m, which corresponds to<br />

about ±0.025 ◦ C. Giving high requirements to accuracy, packaging isolation <strong>of</strong> the<br />

device should be seriously considered. This is especially true at higher temperatures,<br />

at which the resistance <strong>of</strong> isolators may drop significantly. For instance, a 10-M<br />

shunt resistor at 550 ◦ C results in a resistive error <strong>of</strong> about 3 m, which corresponds<br />

to temperature error <strong>of</strong> −0.0075 ◦ C.<br />

16.1.2 Silicon Resistive Sensors<br />

Conductive properties <strong>of</strong> bulk silicon have been successfully implemented for the<br />

fabrication <strong>of</strong> temperature <strong>sensors</strong> with positive temperature coefficient (PTC) characteristics.<br />

Currently, silicon resistive <strong>sensors</strong> are <strong>of</strong>ten incorporated into the micromachined<br />

structures for temperature compensation or direct temperature measurement.<br />

There are also the discrete silicon <strong>sensors</strong> (e.g., the so-called KTY temperature<br />

detectors manufactured by Philips). These <strong>sensors</strong> have reasonably good linearity<br />

(which can be improved by the use <strong>of</strong> simple compensating circuits) and high longterm<br />

stability (typically, ±0.05K per year). The PTC makes them inherently safe for<br />

operation in heating systems:Amoderate overheating (below 200 ◦ C) results in RTD’s<br />

resistance increase and self-protection.<br />

Pure silicon, either polysilicon or single-crystal silicon, intrinsically has a negative<br />

temperature coefficient <strong>of</strong> resistance (NTC) (Fig. 18.1B <strong>of</strong> Chapter 18). However,<br />

when it is doped with an n-type impurity, in a certain temperature range its temperature<br />

coefficient becomes positive (Fig. 16.4). This is a result <strong>of</strong> the fall in the charge carrier<br />

mobility at lower temperatures. At higher temperatures, the number n <strong>of</strong> free charge<br />

carriers increases due to the number n i <strong>of</strong> spontaneously generated charge carriers, and<br />

the intrinsic semiconductor properties <strong>of</strong> silicon predominate. Thus, at temperatures<br />

below 200 ◦ C, the resistivity ρ has a PTC; however, above 200 ◦ C, it becomes negative.<br />

The basic KTY sensor consists <strong>of</strong> an n-type silicon cell having approximate<br />

dimensions <strong>of</strong> 500 × 500 × 240 µm, metallized on one side and having contact areas<br />

on the other side. This produces an effect <strong>of</strong> resistance “spreading,” which causes<br />

a conical current distribution through the crystal, significantly reducing the sensor’s<br />

dependence on manufacturing tolerances. A KTY sensor may be somewhat sensitive<br />

to current direction, especially at larger currents and higher temperatures. To alleviate<br />

this problem, a serially opposite design is employed where two <strong>of</strong> the <strong>sensors</strong> are<br />

connected with opposite polarities to form a dual sensor. These <strong>sensors</strong> are especially<br />

useful for automotive applications.<br />

The typical sensitivity <strong>of</strong> a PTC silicon sensor is on the order <strong>of</strong> 0.7%/ ◦ C; that<br />

is, its resistance changes by 0.7% per every degree Celsius. As for any other sensor<br />

with a mild nonlinearity, the KTY sensor transfer function may be approximated by<br />

a second-order polynomial:<br />

R T = R 0 [1 + A(T − T 0 ) + B(T − T 0 ) 2 ], (16.14)

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