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handbook of modern sensors

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188 5 Interface Electronic Circuits<br />

(A)<br />

(B)<br />

Fig. 5.32. Simplified schematic (A) and timing diagrams (B) <strong>of</strong> a differential capacitance-tovoltage<br />

converter.<br />

Figure 5.32A shows a simplified circuit diagram <strong>of</strong> a switched-capacitor converter<br />

[6], where the variable capacitance C x and reference capacitance C r are parts<br />

<strong>of</strong> a symmetrical silicon pressure sensor. Monolithic MOS switches (1–4) are driven<br />

by opposite-phase clock pulses, φ 1 and φ 2 . When the clocks switch, a charge appears<br />

at the common capacitance node. The charge is provided by the constant-voltage<br />

source, V PM , and is proportional to C x − C r and, therefore, to the applied pressure to<br />

the sensor. This charge is applied to a charge-to-voltage converter which includes an<br />

operational amplifier, integrating capacitor C f , and MOS discharge (reset) switch 5.<br />

The output signal is variable-amplitude pulses (Fig. 5.32B) which can be transmitted<br />

through the communication line and either demodulated to produce a linear signal or<br />

further converted into digital data. So long as the open-loop gain <strong>of</strong> the integrating<br />

OPAM is high, the output voltage is insensitive to stray input capacitance C, <strong>of</strong>fset<br />

voltage, and temperature drift. The minimum detectable signal (noise floor) is determined<br />

by the component noise and temperature drifts <strong>of</strong> the components. The circuit<br />

analysis shows that the minimum noise power occurs when the integration capacitor<br />

C f is approximately equal to the frequency-compensation capacitor <strong>of</strong> the OPAM.<br />

When the MOS reset switch goes from the on state to the <strong>of</strong>f state, the switching<br />

signal injects some charge from the gate <strong>of</strong> the reset transistor to the input summing<br />

node <strong>of</strong> the OPAM (inverting input). This charge propagated through the gate-tochannel<br />

capacitance <strong>of</strong> the MOS transistor 5. An injection charge results in an <strong>of</strong>fset<br />

voltage at the output. This error can be compensated for by a charge-canceling device<br />

[7] which can improve the signal-to-noise ratio by two orders <strong>of</strong> magnitude <strong>of</strong> the<br />

uncompensated charge. The temperature drift <strong>of</strong> the circuit can be expressed as<br />

dV out<br />

dT<br />

= V C x − C r<br />

PM (T Cr − T Cf ), (5.38)<br />

C f<br />

where T Cr is the nominal temperature coefficient <strong>of</strong> C x and C r , and T Cf is the temperature<br />

coefficient <strong>of</strong> integrating capacitor C f . This equation suggests that the tem-

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