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Copyright by William Lloyd Bircher 2010 - The Laboratory for ...

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amplitude distributions is made in Figure 4.7. Note that the CPU distribution is truncated<br />

at 60 Watts to prevent obscuring results from the other subsystems. A small number of<br />

phases (6.5%) exist above 60 Watts and extending to 163 Watts.<br />

<strong>The</strong>se distributions suggest that there are significant opportunities <strong>for</strong> phase-based power<br />

savings <strong>for</strong> CPU, I/O, and disk. <strong>The</strong>se subsystems have more wider and/or multimodal<br />

distributions. <strong>The</strong> larger variations in power consumption provide greater opportunity to<br />

use runtime detection techniques such as [In06] [IsMa06]. In contrast, chipset and<br />

memory have homogeneous behavior suggesting nearly constant power consumption and<br />

less opportunity <strong>for</strong> phase detection.<br />

<strong>The</strong> presence of power variation is not sufficient to motivate the application of power<br />

adaptation. Due to the overhead of detection and transition, adapting <strong>for</strong> short duration<br />

phases may not be worthwhile. Table 4.3 presents the percentage of samples that are<br />

classifiable as phases with durations of 1 ms, 10ms, 100ms and 1000ms. A group of<br />

power samples is considered a phase if the power level within the group remains<br />

constant. To quantify the similarity, the coefficient of variation (CoV) is calculated <strong>for</strong><br />

the group. <strong>The</strong> group is considered a phase if the CoV does not exceed a specified<br />

threshold. <strong>The</strong> boundaries of a phase are determined <strong>by</strong> samples which cause the CoV to<br />

exceed the threshold. Results <strong>for</strong> CoV of 0.25, 0.1 and 0.05 are presented. At thresholds<br />

of 0.25 and 0.1 excessive error exists especially in I/O subsystem phase classifications.<br />

A probable cause of the error is the greater sample-to-sample variability of the I/O power<br />

trace. <strong>The</strong> disk subsystem, which has higher than average error, also has a wider than<br />

56

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