Sepam - HV/MV Protection and control units (ENG) - Trinet

General characteristicsTesting of output effects in rated domainsAimThese tests verify the operation of the device in therated domain of input signal variations, output loads,power supply voltage, etc.One degree of freedom is variable for each test,the other values being kept at their reference values.DC power supplyReference documents:Standards: IEC 60255-22-xx, IEC 61131-2for determination of sensitivity limits.Voltage amplitudeAim: to test the device’s ability to functionwith all acceptable power supply voltages.Alternating componentAim: to test the device’s ability to functionwith an alternating component (rectifier-batterycharger) superimposed on its DC supply voltage.Severity: alternating component (= ripple batteryvoltage) with frequency >100 Hz and peak-to-peakamplitude = 0.12 UnomComments: the test is performed:c at the extreme limits of the power supply domain.Fading cancellationAim: to check the device’s ability to maintain operationin spite of power supply micro-outages(source changeover or faulty device nearby).Severity: 10 voltage outages, at minimum 1 sec.intervals, lasting:75 ms for Vpower = Vnom30 ms for Vpower = VminComments: the voltage outages correspond:c first, to an opening in the power supply line(infinite impedance during disturbance),c then, to a shorting of the power supply line(zero impedance during disturbance).Accidental voltage surgesAim: to test the device’s ability to maintain operationin the presence of transient surge voltage in the powersupply (handling shocks, reactive load switching).Severity: 10 surges, at minimum 1 sec. Intervals,lasting 10 ms, with a maximum slope of 100 V/ms,and maximum amplitude:+ 20 V for Un < 48 V,+ 40 V for Un > 48 V.Analog input circuitsReference documents:Standards: IEC 60255-6 , IEC 61131-2Composition of tests: for each type of input (sensors, process, etc.),testing includes, in particular:c behaviour at limits (saturation, voltage limiter operation).c input currents/voltages when saturated.c passband / recovery time.c permissible overload and dynamic thermal limit for sensor inputs.Logic input circuitsReference documents:Standards: IEC 60255-6, IEC 61131-2Composition of tests: testing includes, in particular:c static inputs.v input dynamics (examination of saturation).v input currents/voltages (examination of saturation)c relay type inputs.v maximum permissible voltage.v input impedance (voltage limiters, R.L. diodes).v resolution (min. duration of a single-shot input signal).v maximum frequency.Logic output circuitsReference documents:Standards: IEC 60255-6, IEC 61131-2Composition of tests:Testing includes, in particular:c static outputs.v effectiveness of protective devices.v maximum length of datacom link.c relay type outputs.v effectiveness of protective devices (damping circuits, overvoltage suppressors).Ambient temperatureAim: to confirm the hypothesis of temperature rise of the device when being cooledby natural air convection in a confined area.Reference documents:Standards: IEC 60068-2-2Comments: This test is complementary to the standardized test describedin the section on "dry heat".Installation - Use - General characteristics - Testing3/9