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Sepam - HV/MV Protection and control units (ENG) - Trinet

Sepam - HV/MV Protection and control units (ENG) - Trinet

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Effects of the environment on the equipmentAimThese tests check device sensitivity <strong>and</strong> resistanceto electromagnetic, mechanical, chemical, etc.interference.Reference documents:St<strong>and</strong>ards: IEC 60255-22-xx for determinationof sensitivity limits.Sensitivity toelectromagnetic interferenceSensitivity to conducted interference1MHz damped waveAim: to test that the device does not operate in anunwanted manner when subjected to high frequencytransients (switching of auxiliary relays or isolationswitches/circuit breakers).Reference documents:St<strong>and</strong>ards: IEC 60255-22-1Severitycircuitstest voltagecommonmodepower supply 2,5 kV 1 kVlogic inputs 2,5 kV 1 kVanalogic inputs 2,5 kV 1 kVlogic outputs 2,5 kV 1 kVdifferentialmodeFast transient burstsAim: to test device immunity when subjected to rapid,repeated electrical transients (inductive load breaks,relay contact bounces).Reference documents:Stadards: IEC 60255-22-4Severitycircuitstest voltage [coupling]modemodecommun différentielpower supply 4 kV [direct] 4 kV [direct]logic inputs 4 kV [direct] 4 kV [direct]analogic inputs 4 kV [direct] 2 kV [direct]logic outputs 4 kV [direct] 4 kV [direct]pocket4 kV [capacitive]terminalsocketSensitivity to radiated interferenceAim: to test that the device does not operate in anunwanted manner when subjected to anelectromagnetic field of radiation (especiallytransmitters/receivers).Reference documents:St<strong>and</strong>ards: IEC 60255-22-3, IEC 61000-4-3Severity: intensity of field:30V/m not modulated10V/m amplitude-modulatedImpulse waveAim: to test the device’s immunity when it is submitted to transients caused bylightning <strong>and</strong> switching (capacitor bank, short-circuit to earth, etc.).Reference document: St<strong>and</strong>ard: IEC 61000-4-5Severitycircuitstest voltage (test impedance)common mode differential modepower supply 2 kV (42 Ω) 1 kV (42 Ω)logic inputs 2 kV (42 Ω) 1 kV (42 Ω)logic outputs 2 kV (42 Ω) 1 kV (42 Ω)phase current inputs (ECM) 2 kV (42 Ω) 1 kV (42 Ω)earth fault current input 2 kV (42 Ω) 1 kV (42 Ω)CT+CSH 30communication interface 2 kV (2 Ω) N/Aon shieldingSensitivity to electrostatic dischargesAim: to test that the device does not operate in an unwanted manner whensubjected to electrostatic discharge (operator contact or nearby objets).Reference documents:St<strong>and</strong>ards: IEC 60255-22-2Severity: generator load voltage: 8 kV in air6 kV on contactTesting in a simulated <strong>MV</strong> environmentAim: to check that there is no nuisance tripping during <strong>MV</strong> switchgear operations.Composition of tests: device installed in a cubicle shunt-wired to a high voltagegenerator.Severity: generator voltage: 30 kV / 50Hz.Number of operations: 30 closing operations.Climatic <strong>and</strong> mechanical robustness testsForeword: Test sequencec the same device undergoes all the tests.c the sequential testing order complies with the recommendationsin the IEC 60068-1 st<strong>and</strong>ard (as testing order maximizes the significanceof the results, each test potentially reveals deterioration caused by previous tests).ColdAim: to test the device's ability to be used at low temperatures.Reference documents:St<strong>and</strong>ards: IEC 60068-2-1Severity:Ad test, without forced air circulation:c device in operation,c temperature: 0 ˚C,c duration: 16 hours,c recovery: 1 hour, device energized.Please note: The pocket terminal is not subjected to the tests.Dry heatAim: to test the device's ability to be used at high temperatures.Reference documents:St<strong>and</strong>ards: IEC 60068-2-2Severity:Bd test, without forced air circulation:c device in operation,c temperature: 55 ˚C.D21 - D22 - D31 - Setting record sheet - test sheet4/19

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