Sepam - HV/MV Protection and control units (ENG) - Trinet

Performance tests in reference conditionsAimThe aim of these tests is to test the special functionalfeatures (hardware and software) of a device in its"reference environment", i.e. temperature, powersupply, etc., using strict tolerances.Checking of parameter specificationsAim: to check conformity of input/output interfacing characteristics.Analog input circuitsCompostion of testsFor each type of input (sensors, process, etc.), minimum testing includes:c dynamics and accuracy (examination of the rated domain),c input impedance (examination of the rated domain),c passband.Logic input circuitsComposition of testsFor each type of input (static relay, etc.), minimum testing includes:c input impedance (exploration of rated domain),c thresholds (high, low, hysteresis),c minimum set-up time (high and low levels).Logic output circuitsComposition of testsFor static type outputs, minimum testing includes:c output dynamics (I or V),c output compliance (I or V),c influence of load (transition time, over/undershoots),c for datacom: protocol, frequency, gigue, etc.For relay type outputs, minimum testing includes:c breaking capacity (min.-max. I/V, load impedance),c bounce time.MiscellaneousInitializationAim: to verify the efficiency of self-testing carried out by the device during start-up.Downgraded operationAim: to verify the efficiency of self-testing carried out by the device whilefunctioning.Module interchangeabilityAim: to test maintenance capability.Comments: the tests include:c power source converter,c core-connector.4/16 D21 - D22 - D31 - Setting record sheet - test sheet