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992 ECONOMIC ANALYSIS OF PV SYSTEMS<br />

Module required price<br />

[$]<br />

340<br />

335<br />

330<br />

325<br />

320<br />

315<br />

310<br />

305<br />

50%<br />

Base case values<br />

Cell test yld 80% Box cost $3/ea<br />

Lens cost $3.40/ft 2 ROE 20%<br />

$4.00/ft 2<br />

Wafer cost $25/ea Sputter eqpt. $400k/ea<br />

$3.60<br />

$30<br />

$240k<br />

24%<br />

$480k<br />

90%<br />

$15 13.3%<br />

$2<br />

$2.55/ft 2<br />

300<br />

60 70 80 90 100 110 120<br />

Percentage of base case parameter value<br />

Cell test yield Lens cost Sputter eqpt. cost<br />

Return on equity Box cost Wafer cost<br />

Figure 21.6 Effect of selected parameters on Fresnel module price (1990$) [4]. Copyright © 2002. Electric<br />

Power Research Institute. EPRI TR-101255. Engineering and Economic Evaluation of Central-Station<br />

Photovoltaic Power Plants. Reprinted with Permission<br />

risk in the choice of inputs. Figure 21.6 shows the effect of different values of certain<br />

materials, equipment, and financial costs on module required price. Cost components are<br />

plotted on the abscissa as a percentage of their base case value, which means that the slope of<br />

the lines represents a relative sensitivity of module price to the parameter change (absolute<br />

values at the extremes are also shown for reference). The output of the STAMPP model<br />

identified the Fresnel lens and the molded box as the two largest material costs, at 31% and<br />

17% of material costs, respectively. Silicon wafers, at 5%, were another significant cost.<br />

Sensitivities to a fairly wide range of these costs are shown, with the extreme variation in<br />

module price being less than 6%. By way of comparison, the price of the most expensive<br />

cell-processing equipment, sputtering, had a much smaller impact on module cost. This<br />

is a typical result in such studies, resulting from the depreciation of the equipment over<br />

several years. Cost of money, represented by return on equity (ROE), has about the same<br />

impact as wafer cost. Process yield for each workstation is a parameter in STAMPP. For cell<br />

manufacturing, the yield at cell test is critical, and the base case cell yield for the study was<br />

80%. Figure 21.6 shows cell yield to have a large impact relative to some other parameters.<br />

The total capital cost of the Fresnel lens plant in Table 21.5 reflects the accounting<br />

system of the study sponsor, EPRI. The $1.62/W p cost of the PV modules includes<br />

shipping and installation, and is 50% of the total system capital cost. The installed arraystructure<br />

cost brings the total collector cost to about 73.5% of the system cost. The power<br />

conditioning and balance-of-plant costs add another 5.5%, leaving about 20% of the cost

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