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FUTURE-GENERATION SOLAR CELLS 403<br />

Current<br />

[mA]<br />

4<br />

2<br />

0<br />

−2<br />

−4<br />

−6<br />

−8<br />

−10<br />

0.0<br />

“Bad” cell shows<br />

high contact resistance<br />

through window layer<br />

0.5<br />

“Bad”<br />

Voltage<br />

[V]<br />

(a)<br />

1.0<br />

“Good”<br />

1.5<br />

Current<br />

[mA]<br />

0<br />

−2<br />

−4<br />

−6<br />

−8<br />

0.0<br />

0.5<br />

Bottom-cell limited<br />

1.0<br />

Voltage<br />

[V]<br />

(b)<br />

Top-cell limited<br />

“Bad”<br />

1.5<br />

“Good”<br />

2.0<br />

Figure 9.18 (a) Comparison of I-V curves for a “good” GaInP cell and a GaInP cell with an extra<br />

junction caused by the AlInP window. Transmission line measurements showed that the contact<br />

resistance was high through the window layer. (b) I-V curves for good and bad GaInP/GaAs<br />

tandem cells. The “bad” curve shows a shunt; measurements of the same cell under bottom-cell<br />

limited and top-cell limited conditions show that the shunt is in the bottom junction<br />

are easiest to observe at high concentration because the V OC of the Ge junction increases<br />

faster with the photocurrent than that of the intended junction. Spurious junctions in the<br />

Ge may add, subtract, or do both (in the case of back-to-back junctions) to the V OC .<br />

When a two-junction cell shows evidence of shunting, it is useful to determine<br />

which of the two junctions is shunted. This can be determined by measuring the light<br />

I-V curve under two different spectra, one of which reduces the photocurrent of the top<br />

junction, and the other which reduces the photocurrent of the bottom junction [120]. The<br />

example in Figure 9.18(b) shows a case in which the bottom cell is shunted. This sort<br />

of problem is often related to defects originating from particulate or poor wafer quality.<br />

Particulate exposure before or during growth is often a bigger problem for GaInP/GaAs<br />

cells than for single-junction cells.<br />

9.8 FUTURE-GENERATION SOLAR CELLS<br />

The GaInP/GaAs/Ge cell is close to maturity for space applications, but the efficiencies<br />

being reported by the manufacturers are continuing to increase, with champion cells<br />

measuring near 30% AM0 efficiency [122]. The efficiency reported by Spectrolab for<br />

a terrestrial concentrator version of the GaInP/GaAs/Ge solar cell [14, 123] is likely to<br />

improve. The theoretical efficiency is 45% at 500 suns under the AM1.5 global spectrum.<br />

Historically, III-V based multijunction cells have achieved 80% to 90% of their theoretical<br />

efficiencies [99].<br />

9.8.1 Refinements to the GaInP/GaAs/Ge Cell<br />

An improvement in the AM0 efficiency of the GaInP/GaAs/Ge cell is predicted when<br />

the GaInP band gap is increased. However, addition of aluminum to the GaInP cell has<br />

been shown to increase the band gap, but not the efficiency, of the top cell because<br />

the J SC was reduced by more than 10% while the V OC increased only slightly, if at all,

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