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636 CADMIUM TELLURIDE SOLAR CELLS<br />

2500<br />

(111)<br />

v<br />

2000<br />

Intensity<br />

[AU]<br />

1500<br />

1000<br />

(220)<br />

v<br />

(311)<br />

v<br />

(400)<br />

v<br />

(331)<br />

v (422)<br />

v<br />

(511)<br />

(333)<br />

v<br />

(531)<br />

v<br />

500<br />

0<br />

20<br />

30<br />

40<br />

50<br />

2-q<br />

[deg]<br />

60<br />

70<br />

80<br />

90<br />

Figure 14.10 X-ray diffraction patterns of PVD CdTe/CdS thin-film structures before and after<br />

vapor CdCl 2 heat treatment at 420 ◦ C for 20 min, showing randomization of the film orientation.<br />

The primary peaks are due to the 1.5-µm-thick CdTe layer; the other peaks are due to the underlying<br />

CdS and ITO films<br />

10<br />

5<br />

0<br />

Current density<br />

[mA/cm 2 ]<br />

−5<br />

−10<br />

a<br />

−15<br />

b<br />

−20<br />

c<br />

−25 −0.5 0 0.5 1<br />

Voltage<br />

[V]<br />

Figure 14.11 Light AM1.5 J –V curves of PVD devices with Cu 2 Te/C contacts and different postdeposition<br />

processing: (a) no heat treatment; (b) treatment at 550 ◦ C for 5 min in air; (c) treatment<br />

in CdCl 2 vapor at 420 ◦ C for 20 min in air [105]

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