24.12.2013 Views

View/Open - ARAN - National University of Ireland, Galway

View/Open - ARAN - National University of Ireland, Galway

View/Open - ARAN - National University of Ireland, Galway

SHOW MORE
SHOW LESS

Create successful ePaper yourself

Turn your PDF publications into a flip-book with our unique Google optimized e-Paper software.

Chapter 2<br />

2.3. Methods for examining bi<strong>of</strong>ilm density and substrata<br />

2.3.1. Atomic Force Microscopy (AFM)<br />

Atomic force microscopy uses a scanning cantilever or probe that taps the<br />

surface <strong>of</strong> a specimen on contact. The probe then gently scans the surface<br />

and based on tapping <strong>of</strong> the surface encountered. A laser beam is aimed at<br />

the outer area <strong>of</strong> the probe. The electrons emitted from the laser are<br />

deflected back to a photo-detector which deciphers the distance <strong>of</strong> the<br />

probe from the surface at each scanned point to measure surface<br />

roughness <strong>of</strong> the overall sample [172] .<br />

2.3.2. Scanning Electron Microscopy (SEM)<br />

SEM is a widely used method for examining bi<strong>of</strong>ilm on surfaces [114, 122,<br />

173-174]. SEM has previously been used and standardised by Williams and<br />

colleagues to confirm bi<strong>of</strong>ilm growth <strong>of</strong> Staphylococcus epidermidis<br />

established using the CBR [174]. Gilmore et al. also used SEM analysis to<br />

confirm dense bi<strong>of</strong>ilm formation by Proteus mirabilis using the CBR [122].<br />

The basic principle <strong>of</strong> SEM is that a beam <strong>of</strong> electrons are emitted from an<br />

electrode gun and accelerated at high voltage (e.g. 20 kiloVolts - kV) onto a<br />

specimen. Once the beam <strong>of</strong> electrons hits the specimen, the electrons<br />

rebound <strong>of</strong>f the surface and are collected through the secondary electron<br />

imaging (SEI) collector [175]. The SEI collector deciphers the electrons<br />

collected and coverts them to digital analogs or signals. The signals are<br />

then converted to grey-scale pixilation using computer programming [175].<br />

In order to optimize conditions for SEM visualization, the specimens are<br />

fixed (primary and secondary fixatives) which preserve the cellular details<br />

<strong>of</strong> the bi<strong>of</strong>ilm [174]. After fixation the specimens are dehydrated in a series<br />

<strong>of</strong> ethanol to remove excess water from the sample [175]. Any water<br />

remaining may destroy the sample if overheated in the SEM chamber. The<br />

ethanol series is followed by the addition <strong>of</strong> a critical point dryer to<br />

eliminate surface tension from liquids on the surface <strong>of</strong> the specimen.<br />

Hexamethyldisilizane (HMDS) is now recognised as a safer option for<br />

Page<br />

49

Hooray! Your file is uploaded and ready to be published.

Saved successfully!

Ooh no, something went wrong!