i A PHYSICAL IMPLEMENTATION WITH CUSTOM LOW POWER ...

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Figure 6-27: Layout of a 80fF drive buffer The Liberty Format description of a delay element includes its rise power, fall power, cell rise delay, cell fall delay, rise transition time, fall transition time, leakage power during ON state, leakage power during OFF state. The Synopsys Liberty Format terminologies are described below. Rise Power Energy Consumed by the cell when the input makes a transition from a logic low to a logic high value. Fall Power Energy Consumed by the cell when the input makes a transition from a logic high to a logic low value. 110
Cell Rise Delay The Cell Rise Delay is measured when the output makes a transition from a logic low to a logic high. Delay measured between the input reaching 50% of its final value to the output reaching 50% of its final value is defined as the Cell Rise Delay. Figure 6-28 shows the Cell Rise delay measurement waveform. Cell Fall Delay Figure 6-28: Cell Rise Delay Measurement The Cell Fall Delay is measured when the output makes a transition from a logic low to a logic high. Delay measured between the input reaching 50% of its final value to the output reaching 50% of its final value is defined as the Cell Rise Delay. Figure 6-29 shows the Cell Fall delay measurement waveform. 111
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A PHYSICAL IMPLEMENTATION WITH CUST
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A PHYSICAL IMPLEMENTATION WITH CUST
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4.0 ASIC DESIGN FLOW ..............
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6.5.5 Characterization Results for
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LIST OF TABLES Table 5-1: ALU Modul
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LIST OF FIGURES Figure 1-1: SuperCI
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Figure 5-20: BIGFABRIC Logical Diag
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Figure 7-4: EEPROM Erase Physical O
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ACKNOWLEDGEMENTS “Many, O Jehovah
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1.0 INTRODUCTION Technological adva
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Property) block. The physical desig
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the thesis proposes a power gated m
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2.0 SUPERCISC RECONFIGURABLE HARDWA
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The specifications of the hardware
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INP2 selects from ALU1, ALU2, ALU3
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3.0 POWER ESTIMATION The need for e
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3.1.1 Static Power Consumption Stat
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Internal Power Internal Power is th
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Switching activity Generation Switc
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Figure 3-4: Leakage Power definitio
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The entire array contains informati
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3.3.2 Calculation of Fall Power Fig
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Figure 3-10: Off-state leakage Powe
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Figure 4-1 : Typical ASIC Design Fl
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Figure 4-2: ASIC Physical Design Fl
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4.1.2 Powerplanning Power planning
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created in the design. Routing feed
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4.1.7 Routing Once the standard cel
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Table 5-1: ALU Module Specification
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Table 5-2 shows the important speci
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the basic parameters are specified,
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direction have to be aligned on the
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ALU Stripe Pin Assignment The “ib
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5.2.1 MUX Module Specifications As
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Figure 5-12: MUX Stripe Logical Dia
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MUX initialization routine The MUX
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Table 5-10: MUX Stripe Pin Placemen
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Figure 5-15: FINALMUX Module Logica
Page 77 and 78: Table 5-12: Final MUX Stripe Specif
Page 79 and 80: pins in the FINALMUX stripe is plac
Page 81 and 82: larger system. Figure 5-22 shows th
Page 83 and 84: Figure 5-20: BIGFABRIC Logical Diag
Page 85 and 86: Figure 5-22: Place and Routed BIGFA
Page 87 and 88: BIGFABRIC Stripe Pin Assignment As
Page 89 and 90: The SPEF file can be generated usin
Page 91 and 92: 5.5.1 Power Results for ADPCM Encod
Page 93 and 94: 5.5.3 Power Results for IDCT Row Be
Page 95 and 96: 5.5.5 Power Results for Sobel Bench
Page 97 and 98: 6.0 DELAY ELEMENTS FOR LOW POWER FA
Page 99 and 100: Transmission gate with Schmitt Trig
Page 101 and 102: PMOS transistors have their gate in
Page 103 and 104: output normally. The signal integri
Page 105 and 106: m-Transistor Cascaded Inverter This
Page 107 and 108: 6.2 LOW POWER FABRIC USING DELAY EL
Page 109 and 110: The use of delay elements in the ha
Page 111 and 112: 6.3.2 Dynamic Triggering Scheme A d
Page 113 and 114: Figure 6-16 shows the shunt current
Page 115 and 116: td1 is the delay in discharging nod
Page 117 and 118: δt is the regeneration time of the
Page 119 and 120: transistors, they are active low si
Page 121 and 122: delay elements are enabled on a log
Page 123 and 124: charge sharing happens between the
Page 125 and 126: Figure 6-23: AND gate to generate D
Page 127: uffer with a drive capacity of 640f
Page 131 and 132: Fall Transition Time The time taken
Page 133 and 134: 6.5.6 Characterization Results for
Page 135 and 136: 7.0 EEPROM CIRCUIT DESIGN EEPROM (E
Page 137 and 138: 7.1.1 Erase Operation Figure 7-3: I
Page 139 and 140: 7.1.2 Write Operation Figure 7-6: I
Page 141 and 142: Figure 7-9: IV Characteristics of a
Page 143 and 144: The current source IFN, resistor RT
Page 145 and 146: Figure 7-11: HSPICE Description of
Page 147 and 148: 7.2.1 Ramp Generator The ramp gener
Page 149 and 150: 7.2.4 Column Latch for Bitlines inp
Page 151 and 152: 7.2.5 Power Multiplexer Figure 7-16
Page 153 and 154: The inverter pair connected to the
Page 155 and 156: 7.2.7 Memory Bank Architecture Figu
Page 157 and 158: 7.2.8 Memory Bank Simulation Figure
Page 159 and 160: (Vpp) and a normal voltage (Vdd), t
Page 161 and 162: 8.1.2 Dynamic Decoder The address d
Page 163 and 164: 8.3 POWER-ON RESET One problem with
Page 165 and 166: Figure 8-6 shows the modified charg
Page 167 and 168: To study the impact of the power co
Page 169 and 170: 9.0 CONCLUSION For this thesis, I h
Page 171 and 172: definitions, metal layer resistance
Page 173 and 174: APPENDIX B element standard cell ch
Page 175 and 176: $k=-1; $j=-1; $i=-1; foreach $ load
Page 177 and 178: $FALL_START_8 = $OFFSET8 + $ONTIME;
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if ($#rise_power_6 == -1) { # $modi
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$modified_spice_array[$i] = $temp2;
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@fall_power_9 = grep(/fall_power9/,
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print MEASHANDLE $_; print ENERGYHA
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} print MEASHANDLE " "; print ENERG
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set VAL [expr "$NUMBER_OF_MODULES_P
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set DIE_WIDTH_STRIPE [expr {($MODUL
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#*************************PLACING i
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preassignPin stripe $PIN_NAME -loc
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set X_LOC [expr {($X _LOC -( 31*$OU
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#Module related details set NUMBER_
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set X_LOC 0 set Y_LOC 41.2 for {set
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Table D 1 (Continued) 506.232fF 0.0
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121.344fF 0.076ns 0.4634 0.2277 570
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Table D 5 (Continued) 9.48 0. 516 0
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Table D 7: Characterization data fo
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Transi tion Table D 9: Characteriza
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[13] M.F. Aburdene, J. Zheng, and R
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i A PHYSICAL IMPLEMENTATION WITH CUSTOM LOW POWER ...

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