i A PHYSICAL IMPLEMENTATION WITH CUSTOM LOW POWER ...
i A PHYSICAL IMPLEMENTATION WITH CUSTOM LOW POWER ...
i A PHYSICAL IMPLEMENTATION WITH CUSTOM LOW POWER ...
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8.1.2 Dynamic Decoder<br />
The address decoder to select the memory bank that needs to be enabled can be constructed using<br />
static or dynamic CMOS circuits. Our design uses a dynamic CMOS gate with a pre-charge<br />
transistor acting as the pull up network [6]. The dynamic decoder is a low-power alternative [30].<br />
The pre-charge signal is driven by a periodic signal related<br />
to the clock. In our case we can use<br />
the system clock directly as the pre-charge signal. For a rising edge triggered memory, when<br />
pre-charge is `1' the pre-charge PMOS transistor is off and the pre-charge NMOS transistor is on,<br />
allowing the pull down network or evaluation<br />
network to pull the appropriate power enable line<br />
to ground, thus turning on the associated memory block. On the back half of the cycle, pre-<br />
charge is '0' turning on the pre-charge PMOS and disconnecting the power enable line from<br />
ground, thus turning off all the memory blocks.<br />
The read power consumed during a read operation includes<br />
the power required to<br />
precharge the source terminal of the FLOTOX transistor, the power consumed by the sense<br />
amplifier circuitry, and the row and column decoder power. The read operation is typically a low<br />
voltage operation mode except for the word line boosting and bit line boosting schemes are used<br />
to decrease the read time.<br />
8.2 MEMORY BLOCK <strong>POWER</strong> CONSUMPTION<br />
Many advanced low power circuit design techniques for Embedded EEPROMS have been<br />
reported [24] [25]. The EEPROM power consumption can be categorized as 1) read power<br />
consumption and 2) write power consumption.<br />
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