i A PHYSICAL IMPLEMENTATION WITH CUSTOM LOW POWER ...

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1. EEPROM cell 2. Sense Amplifier 3. High Voltage Generator Using Charge Pump 4. Ramp Generator 5. Word Line Level shifter 6. Column Latch for the bit lines 7. Power multiplexer EEPROM Cell Practical implementation of the EEPROM requires a memory process design kit with FLOTOX transistor models. In the absence such a design kit, EEPROM macromodels which model the DC and transient characteristics can be used to simulate the EEPROM. The EEPROM model used in the design has been based on the macromodel described in [21]. Macromodel Description The macromodel description is entirely based on the model proposed by the paper [21]. The Figure 7-10 shows the circuit schematic of the macromodel description. Transistor M1 is an NMOS transistor. The Fowler-Nordheim tunneling current is modeled as a voltage-controlled current source GFN. The value of GFN is given by the expression shown in Equation 7-1 [21]. V fg −Vt ( V fg −Vt ) ttun = A α . exp( −β t t V −V GFN tun tun Equation 7-1: Fowler-Nordheim Tunneling Current 124 tun fg t )
The current source IFN, resistor RT and capacitor CT are used to model the charge storage and retention capabilities of the EEPROM [21]. The IFN is a current-controlled current source which senses the tunneling current GFN with a gain of unity. RT is chosen to be a very high value, so that most of the current IFN is supplied to the capacitor CT [21]. The floating gate is modeled by the controlled source EFG. The value of the floating gate voltage is given by Equation 7-2 [21]. fg, initial V fg = α dVd + αsVs + αcgVcg + αbVb + α tunVtun + + Ct Q Equation 7-2: Expression for Floating Gate Voltage ΔQ The remaining part of the circuit is used to model Φsi, the surface potential of silicon under the tunnel oxide. The original description of the SPICE code as shown in the paper has been translated to HSPICE for use in HSPICE simulations. The HSPICE description of the macromodel is shown in Figure 7-11. The low-voltage and high voltage device models are based on the description given in [22]. The high voltage devices had an effective length of 1um and a tox (oxide thickness) of 275 Angstrom [22]. The low voltage devices had an effective length of 0.35um and a thickness of 75 Angstrom [22]. 125 C t fg
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A PHYSICAL IMPLEMENTATION WITH CUST
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A PHYSICAL IMPLEMENTATION WITH CUST
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4.0 ASIC DESIGN FLOW ..............
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6.5.5 Characterization Results for
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LIST OF TABLES Table 5-1: ALU Modul
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LIST OF FIGURES Figure 1-1: SuperCI
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Figure 5-20: BIGFABRIC Logical Diag
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Figure 7-4: EEPROM Erase Physical O
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ACKNOWLEDGEMENTS “Many, O Jehovah
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1.0 INTRODUCTION Technological adva
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Property) block. The physical desig
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the thesis proposes a power gated m
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2.0 SUPERCISC RECONFIGURABLE HARDWA
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The specifications of the hardware
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INP2 selects from ALU1, ALU2, ALU3
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3.0 POWER ESTIMATION The need for e
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3.1.1 Static Power Consumption Stat
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Internal Power Internal Power is th
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Switching activity Generation Switc
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Figure 3-4: Leakage Power definitio
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The entire array contains informati
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3.3.2 Calculation of Fall Power Fig
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Figure 3-10: Off-state leakage Powe
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Figure 4-1 : Typical ASIC Design Fl
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Figure 4-2: ASIC Physical Design Fl
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4.1.2 Powerplanning Power planning
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created in the design. Routing feed
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4.1.7 Routing Once the standard cel
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Table 5-1: ALU Module Specification
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Table 5-2 shows the important speci
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the basic parameters are specified,
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direction have to be aligned on the
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ALU Stripe Pin Assignment The “ib
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5.2.1 MUX Module Specifications As
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Figure 5-12: MUX Stripe Logical Dia
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MUX initialization routine The MUX
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Table 5-10: MUX Stripe Pin Placemen
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Figure 5-15: FINALMUX Module Logica
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Table 5-12: Final MUX Stripe Specif
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pins in the FINALMUX stripe is plac
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larger system. Figure 5-22 shows th
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Figure 5-20: BIGFABRIC Logical Diag
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Figure 5-22: Place and Routed BIGFA
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BIGFABRIC Stripe Pin Assignment As
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The SPEF file can be generated usin
Page 91 and 92: 5.5.1 Power Results for ADPCM Encod
Page 93 and 94: 5.5.3 Power Results for IDCT Row Be
Page 95 and 96: 5.5.5 Power Results for Sobel Bench
Page 97 and 98: 6.0 DELAY ELEMENTS FOR LOW POWER FA
Page 99 and 100: Transmission gate with Schmitt Trig
Page 101 and 102: PMOS transistors have their gate in
Page 103 and 104: output normally. The signal integri
Page 105 and 106: m-Transistor Cascaded Inverter This
Page 107 and 108: 6.2 LOW POWER FABRIC USING DELAY EL
Page 109 and 110: The use of delay elements in the ha
Page 111 and 112: 6.3.2 Dynamic Triggering Scheme A d
Page 113 and 114: Figure 6-16 shows the shunt current
Page 115 and 116: td1 is the delay in discharging nod
Page 117 and 118: δt is the regeneration time of the
Page 119 and 120: transistors, they are active low si
Page 121 and 122: delay elements are enabled on a log
Page 123 and 124: charge sharing happens between the
Page 125 and 126: Figure 6-23: AND gate to generate D
Page 127 and 128: uffer with a drive capacity of 640f
Page 129 and 130: Cell Rise Delay The Cell Rise Delay
Page 131 and 132: Fall Transition Time The time taken
Page 133 and 134: 6.5.6 Characterization Results for
Page 135 and 136: 7.0 EEPROM CIRCUIT DESIGN EEPROM (E
Page 137 and 138: 7.1.1 Erase Operation Figure 7-3: I
Page 139 and 140: 7.1.2 Write Operation Figure 7-6: I
Page 141: Figure 7-9: IV Characteristics of a
Page 145 and 146: Figure 7-11: HSPICE Description of
Page 147 and 148: 7.2.1 Ramp Generator The ramp gener
Page 149 and 150: 7.2.4 Column Latch for Bitlines inp
Page 151 and 152: 7.2.5 Power Multiplexer Figure 7-16
Page 153 and 154: The inverter pair connected to the
Page 155 and 156: 7.2.7 Memory Bank Architecture Figu
Page 157 and 158: 7.2.8 Memory Bank Simulation Figure
Page 159 and 160: (Vpp) and a normal voltage (Vdd), t
Page 161 and 162: 8.1.2 Dynamic Decoder The address d
Page 163 and 164: 8.3 POWER-ON RESET One problem with
Page 165 and 166: Figure 8-6 shows the modified charg
Page 167 and 168: To study the impact of the power co
Page 169 and 170: 9.0 CONCLUSION For this thesis, I h
Page 171 and 172: definitions, metal layer resistance
Page 173 and 174: APPENDIX B element standard cell ch
Page 175 and 176: $k=-1; $j=-1; $i=-1; foreach $ load
Page 177 and 178: $FALL_START_8 = $OFFSET8 + $ONTIME;
Page 179 and 180: if ($#rise_power_6 == -1) { # $modi
Page 181 and 182: $modified_spice_array[$i] = $temp2;
Page 183 and 184: @fall_power_9 = grep(/fall_power9/,
Page 185 and 186: print MEASHANDLE $_; print ENERGYHA
Page 187 and 188: } print MEASHANDLE " "; print ENERG
Page 189 and 190: set VAL [expr "$NUMBER_OF_MODULES_P
Page 191 and 192: set DIE_WIDTH_STRIPE [expr {($MODUL
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#*************************PLACING i
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preassignPin stripe $PIN_NAME -loc
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set X_LOC [expr {($X _LOC -( 31*$OU
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#Module related details set NUMBER_
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set X_LOC 0 set Y_LOC 41.2 for {set
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Table D 1 (Continued) 506.232fF 0.0
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121.344fF 0.076ns 0.4634 0.2277 570
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Table D 5 (Continued) 9.48 0. 516 0
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Table D 7: Characterization data fo
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Transi tion Table D 9: Characteriza
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[13] M.F. Aburdene, J. Zheng, and R
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