i A PHYSICAL IMPLEMENTATION WITH CUSTOM LOW POWER ...

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Figure 7-15 is asserted for a short duration of time. When LOAD gets asserted, the new data value that needs to be written into the EEPROM cell gets loaded into the latch and the value is stored at node X by the cross coupled inverter even after LOAD gets de-asserted. Under normal conditions, DIS_BL_CTRL gets asserted and signal IN2 is asserted and signal IN1 is de- asserted pulling the output of the level shifter to Vpp. This effectively turns off the pass transistor connected to the bit line. When the data needs to be programmed into the EEPROM cell, DIS_BL_CTRL gets de-asserted and DATA_CTRL is asserted. This loads the data into nodes IN2 and IN1. Depending on the value of IN2 and IN1, the level shifter either discharges or charges to enable the pass transistor as shown in Figure 7-16. The enabling of the pass transistor connects the programming voltage to the bit line and the disabling of the pass transistor tri-states the bitline. For an EEPROM cell to be programmed the pass transistor is enabled and the bit line is connected to the programming ramp generated by the ramp generator as described in the section 7.2.2. The DIS_BL, shown in Figure 7-16 is asserted to pull the BL node to ground during an erase operation. The DIS_BL can also be asserted during a read operation to discharge any unwanted voltages that get coupled to the bit line. Figure 7-15: Data Latch Schematic of Column Latch 132
7.2.5 Power Multiplexer Figure 7-16: Level Shifter and Pass Transistor for Column Latch The design of the power multiplexer is based on the patent US 7,005,911 [27]. As the EEPROM erase and program operations are high voltage operations, and the read being a low voltage operation, it is necessary to have a power multiplexer which could choose between the high and low voltages depending on the operation performed. Such circuits are essential at the input to the word-line level shifter. The level shifter would receive a high voltage from the power multiplexer for an erase and program operation and a low voltage for a read operation. Power multiplexers are also used to connect to the column gates, which output a high voltage during the erase operation, a ground voltage during program operation and a low voltage during a read operation. Figure 7-17 shows the schematic of the power multiplexer used in the design. The LS1 and Vdd_switch as shown in Figure 7-17 are essentially level shifters used to shift the output to Vpp or Vdd depending on the enable input. 133
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A PHYSICAL IMPLEMENTATION WITH CUST
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A PHYSICAL IMPLEMENTATION WITH CUST
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4.0 ASIC DESIGN FLOW ..............
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6.5.5 Characterization Results for
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LIST OF TABLES Table 5-1: ALU Modul
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LIST OF FIGURES Figure 1-1: SuperCI
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Figure 5-20: BIGFABRIC Logical Diag
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Figure 7-4: EEPROM Erase Physical O
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ACKNOWLEDGEMENTS “Many, O Jehovah
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1.0 INTRODUCTION Technological adva
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Property) block. The physical desig
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the thesis proposes a power gated m
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2.0 SUPERCISC RECONFIGURABLE HARDWA
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The specifications of the hardware
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INP2 selects from ALU1, ALU2, ALU3
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3.0 POWER ESTIMATION The need for e
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3.1.1 Static Power Consumption Stat
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Internal Power Internal Power is th
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Switching activity Generation Switc
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Figure 3-4: Leakage Power definitio
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The entire array contains informati
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3.3.2 Calculation of Fall Power Fig
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Figure 3-10: Off-state leakage Powe
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Figure 4-1 : Typical ASIC Design Fl
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Figure 4-2: ASIC Physical Design Fl
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4.1.2 Powerplanning Power planning
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created in the design. Routing feed
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4.1.7 Routing Once the standard cel
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Table 5-1: ALU Module Specification
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Table 5-2 shows the important speci
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the basic parameters are specified,
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direction have to be aligned on the
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ALU Stripe Pin Assignment The “ib
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5.2.1 MUX Module Specifications As
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Figure 5-12: MUX Stripe Logical Dia
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MUX initialization routine The MUX
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Table 5-10: MUX Stripe Pin Placemen
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Figure 5-15: FINALMUX Module Logica
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Table 5-12: Final MUX Stripe Specif
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pins in the FINALMUX stripe is plac
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larger system. Figure 5-22 shows th
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Figure 5-20: BIGFABRIC Logical Diag
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Figure 5-22: Place and Routed BIGFA
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BIGFABRIC Stripe Pin Assignment As
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The SPEF file can be generated usin
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5.5.1 Power Results for ADPCM Encod
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5.5.3 Power Results for IDCT Row Be
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5.5.5 Power Results for Sobel Bench
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6.0 DELAY ELEMENTS FOR LOW POWER FA
Page 99 and 100: Transmission gate with Schmitt Trig
Page 101 and 102: PMOS transistors have their gate in
Page 103 and 104: output normally. The signal integri
Page 105 and 106: m-Transistor Cascaded Inverter This
Page 107 and 108: 6.2 LOW POWER FABRIC USING DELAY EL
Page 109 and 110: The use of delay elements in the ha
Page 111 and 112: 6.3.2 Dynamic Triggering Scheme A d
Page 113 and 114: Figure 6-16 shows the shunt current
Page 115 and 116: td1 is the delay in discharging nod
Page 117 and 118: δt is the regeneration time of the
Page 119 and 120: transistors, they are active low si
Page 121 and 122: delay elements are enabled on a log
Page 123 and 124: charge sharing happens between the
Page 125 and 126: Figure 6-23: AND gate to generate D
Page 127 and 128: uffer with a drive capacity of 640f
Page 129 and 130: Cell Rise Delay The Cell Rise Delay
Page 131 and 132: Fall Transition Time The time taken
Page 133 and 134: 6.5.6 Characterization Results for
Page 135 and 136: 7.0 EEPROM CIRCUIT DESIGN EEPROM (E
Page 137 and 138: 7.1.1 Erase Operation Figure 7-3: I
Page 139 and 140: 7.1.2 Write Operation Figure 7-6: I
Page 141 and 142: Figure 7-9: IV Characteristics of a
Page 143 and 144: The current source IFN, resistor RT
Page 145 and 146: Figure 7-11: HSPICE Description of
Page 147 and 148: 7.2.1 Ramp Generator The ramp gener
Page 149: 7.2.4 Column Latch for Bitlines inp
Page 153 and 154: The inverter pair connected to the
Page 155 and 156: 7.2.7 Memory Bank Architecture Figu
Page 157 and 158: 7.2.8 Memory Bank Simulation Figure
Page 159 and 160: (Vpp) and a normal voltage (Vdd), t
Page 161 and 162: 8.1.2 Dynamic Decoder The address d
Page 163 and 164: 8.3 POWER-ON RESET One problem with
Page 165 and 166: Figure 8-6 shows the modified charg
Page 167 and 168: To study the impact of the power co
Page 169 and 170: 9.0 CONCLUSION For this thesis, I h
Page 171 and 172: definitions, metal layer resistance
Page 173 and 174: APPENDIX B element standard cell ch
Page 175 and 176: $k=-1; $j=-1; $i=-1; foreach $ load
Page 177 and 178: $FALL_START_8 = $OFFSET8 + $ONTIME;
Page 179 and 180: if ($#rise_power_6 == -1) { # $modi
Page 181 and 182: $modified_spice_array[$i] = $temp2;
Page 183 and 184: @fall_power_9 = grep(/fall_power9/,
Page 185 and 186: print MEASHANDLE $_; print ENERGYHA
Page 187 and 188: } print MEASHANDLE " "; print ENERG
Page 189 and 190: set VAL [expr "$NUMBER_OF_MODULES_P
Page 191 and 192: set DIE_WIDTH_STRIPE [expr {($MODUL
Page 193 and 194: #*************************PLACING i
Page 195 and 196: preassignPin stripe $PIN_NAME -loc
Page 197 and 198: set X_LOC [expr {($X _LOC -( 31*$OU
Page 199 and 200: #Module related details set NUMBER_
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set X_LOC 0 set Y_LOC 41.2 for {set
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Table D 1 (Continued) 506.232fF 0.0
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121.344fF 0.076ns 0.4634 0.2277 570
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Table D 5 (Continued) 9.48 0. 516 0
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Table D 7: Characterization data fo
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Transi tion Table D 9: Characteriza
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[13] M.F. Aburdene, J. Zheng, and R
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