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i A PHYSICAL IMPLEMENTATION WITH CUSTOM LOW POWER ...

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8.0 <strong>POWER</strong> GATED EEPROM DESIGN<br />

High power consumption has always been an issue with EEPROM design because of the<br />

inherent nature of the FLOTOX memory processes that use a high voltage to program these<br />

devices. Many circuit level optimizations have been made in the past to reduce the power<br />

consumption of the basic EEPROM block. The thesis proposes an architectural level power<br />

optimization using power gating technique to increase the size of the memory while keeping the<br />

active power low. The power-gated memory design minimizes both the dynamic and leakage<br />

power associated with memories. Simulations have been performed using HSPICE models for a<br />

0.35um CMOS process.<br />

Our solution is to build a hierarchical low-power memory block using power-gating<br />

technique for the non-accessed memory block. The concept of multi-block architecture [28] is a<br />

common low power technique used in memory design. However, the use of power gating<br />

reduces the power consumption si gnificantly as compared to other sleep mode techniques.<br />

8.1 ARCHITECTURE OF THE <strong>POWER</strong> GATED MEMORY<br />

A ``power enable'' PMOS device is added in series with the memory block as shown in<br />

Figure 8-1. This allows only the block that is actually addressed to be powered, while the<br />

remaining blocks remain disconnected from power. As the EEPROM uses both a high voltage<br />

140

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