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1996 Electronics Industry Environmental Roadmap - Civil and ...

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Emerging Technologies<br />

94<br />

Planarization Solid/liquid/gaseous waste depending on process<br />

Dielectric deposition <strong>and</strong> etch Gaseous waste<br />

Cleaning (used between many steps) Liquid <strong>and</strong> gaseous waste stream, especially<br />

sulfuric acid <strong>and</strong> water<br />

General facilities Energy consumption for lighting, air conditioning<br />

<strong>and</strong> air h<strong>and</strong>ling<br />

Table 6-1. <strong>Environmental</strong> impact of some common semiconductor manufacturing processes.<br />

Wafer size continues to increase from the present 150 to 200 mm <strong>and</strong> with larger wafers will<br />

come smaller feature sizes <strong>and</strong> finer line widths. This growing complexity leads to an increased<br />

requirement for photomasks, with SIA projecting that the minimum mask count will grow from<br />

eighteen today to twenty-four or more by the year 2010. Additional metallization layers will also<br />

be required to manage the increased complexity. As pointed out by the SIA roadmap [31]:<br />

“With each generation of logic products <strong>and</strong> microprocessors, the capability to<br />

fabricate more devices in silicon exceeds the ability to wire them. This results in<br />

a dramatic increase in the number of metal levels.”

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