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1996 Electronics Industry Environmental Roadmap - Civil and ...

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Appendix A<br />

SIA/SEMATECH The effects of specific molecular contaminants on semiconductor<br />

manufacturing processes are not well understood <strong>and</strong> the capability to<br />

measure <strong>and</strong> control molecular contamination is not well developed.<br />

Improvements are required in the level of st<strong>and</strong>ardization <strong>and</strong> tool<br />

interfaces, wafer carrier orientation, ergonomic compliance, wafer-tocassette<br />

precision, <strong>and</strong> high precision mechanical couplings between<br />

wafer carriers <strong>and</strong> process tools.<br />

Priorities include developing accurate contamination measuring <strong>and</strong><br />

modeling techniques, st<strong>and</strong>ardizing carriers <strong>and</strong> carrier interfaces,<br />

defining cost effective, contamination-free material movement<br />

mechanization approaches, <strong>and</strong> modularizing contamination control<br />

<strong>and</strong> material movement systems.<br />

NEMI<br />

IPC<br />

OIDA<br />

Displays<br />

SIA/SEMATECH<br />

NEMI<br />

IPC<br />

OIDA Key market targets for displays include today’s high volume, high<br />

value market for flat panel displays for laptop computers <strong>and</strong> other<br />

portable information devices <strong>and</strong> the market likely to emerge later this<br />

decade for larger TV/HDTV displays. Key areas for exp<strong>and</strong>ed R&D<br />

include large area photolithography, high resolution printing<br />

techniques, packaging/integration of displays <strong>and</strong> drive electronics,<br />

low cost drive electronics, inspection <strong>and</strong> repair techniques, <strong>and</strong> inprocess<br />

measurement techniques.<br />

134<br />

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