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Introduction to Nanotechnology

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6.1. SOLID DISORDERED NANOSTRUCTURES 141<br />

tion movement. However, nanostructured copper prepared by electrodeposition<br />

displays almost no residual stress and-has elongations up <strong>to</strong> 30% as shown in<br />

Fig. 6.10. These results emphasize the importance of the choice of processing<br />

procedures, and the effect of flaws and microstructure on measured mechanical<br />

properties. In general, the results of ductility measurements on nanostructured bulk<br />

materials are mixed because of sensitivity <strong>to</strong> flaws and porosity, both of which<br />

depend on the processing methods.<br />

6.1.4. Nanostructured Multilayers<br />

Another kind of bulk nanostructure consists of periodic layers of nanometer<br />

thickness of different materials such as alternating layers of TiN and NbN. These<br />

layered materials are fabricated by various vapor-phase methods such as sputter<br />

deposition and chemical vapor-phase deposition. They can also be made by<br />

electrochemical deposition, which is discussed in Section 6.1.1. The materials<br />

have very large interface area densities. This means that the density of a<strong>to</strong>ms on<br />

the planar boundary between two layers is very high. For example, a square<br />

centimeter of a 1-pm-thick multilayer film having layers of 2nm thickness has an<br />

interface area of 1000 cm2. Since the material has a density of about 6.5 g/cm3, the<br />

interface area density is 154m2/g, comparable <strong>to</strong> that of typical heterogeneous<br />

catalysts (see Chapter 10). The interfacial regions have a strong influence on the<br />

properties of these materials. These layered materials have very high hardness,<br />

200<br />

- 150<br />

2<br />

v)<br />

5 100<br />

3<br />

50<br />

0 0 5 10 15 20 25 30<br />

Strain (Yo)<br />

Figure 6.10. Stress-strain curve of nanostructured copper prepared by electrodeposition.<br />

[Adapted from L. Lu et al., J. Mater. Res. 15, 270 (2000).]

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