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Introduction to Nanotechnology

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232 QUANTUM WELLS, WIRES, AND DOTS<br />

Table 9.1. Number of a<strong>to</strong>ms on the surface b&, number in the volume IU,, and percentage<br />

of a<strong>to</strong>ms Ns/IU, on the surface of a nanoparticle*<br />

Size na Total Number Number of Percent of A<strong>to</strong>ms<br />

n (nm) of A<strong>to</strong>ms Surface A<strong>to</strong>ms on Surface<br />

2<br />

3<br />

4<br />

5<br />

6<br />

10<br />

15<br />

25<br />

50<br />

I00<br />

1.13<br />

1.70<br />

2.26<br />

2.83<br />

3.39<br />

5.65<br />

8.48<br />

14.1<br />

28.3<br />

56.5<br />

94<br />

279<br />

62 0<br />

1165<br />

1962<br />

8630<br />

2.84 io4<br />

1.29 x lo5<br />

1.02 x lo6<br />

8.06 x lo6<br />

48<br />

108<br />

192<br />

300<br />

432<br />

1200<br />

2700<br />

7500<br />

3.0 io4<br />

1.2 io5<br />

51.1<br />

38.7<br />

31.0<br />

25.8<br />

22.0<br />

13.9<br />

9.5<br />

5.8<br />

2.9<br />

1.5<br />

"The nanoparticle has a diamond lattice structure in the shape of a cube n unit cells on a side, having a<br />

width nu, where u is the unit cell dimension. Column 2 gives sizes for GaAs, which has u = 0.565 nm.<br />

the particle. This is expected because according <strong>to</strong> the way the calculation was<br />

carried out, only one of the two types of a<strong>to</strong>ms in the GaAs structure contributes <strong>to</strong><br />

the surface.<br />

A charge carrier in a conduc<strong>to</strong>r or semiconduc<strong>to</strong>r has its forward motion in an<br />

applied electric field periodically interrupted by scattering off phonons and defects.<br />

An electron or hole moving with a dnft velocity v will, on the average, experience a<br />

scattering event every z seconds, and travel a distance I called the mean free path<br />

between collisions, where<br />

I = vz (9.4)<br />

This is called intraband scattering because the charge carrier remains in the same<br />

band after scattering, such as the valence band in the case of holes. Mean free paths<br />

in metals depend strongly on the impurity content, and in ordinary metals typical<br />

values might be in the low nanometer range, perhaps from 2 <strong>to</strong> 50 nm. In very pure<br />

samples they will, of course, be much longer. The resistivity of a polycrystalline<br />

conduc<strong>to</strong>r or semiconduc<strong>to</strong>r composed of microcrystallites with diameters signifi-<br />

cantly greater than the mean free path resembles that of a network of interconnected<br />

resis<strong>to</strong>rs, but when the microcrystallite dimensions approach or become less than I,<br />

the resistivity depends mainly on scattering off boundaries between crystallites. Both<br />

types of metallic nanostructures are common.<br />

Various types of defects in a lattice can interrupt the forward motion of<br />

conduction electrons, and limit the mean free path. Examples of zero-dimensional<br />

defects are missing a<strong>to</strong>ms called vacancies, and extra a<strong>to</strong>ms called interstitial a<strong>to</strong>ms<br />

located between standard lattice sites. A vacancy-interstitial pair is called a Frenkel<br />

defect. An example of a one-dimensional dislocation is a lattice defect at an edge, or<br />

a partial line of missing a<strong>to</strong>ms. Common two-dimensional defects are a boundary

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