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Introduction to Nanotechnology

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El X-RAY<br />

TUBE<br />

8000 - A<br />

6000 -<br />

4000 -<br />

2000<br />

X-RAY PHOTOELECTRON SPECTROMETER<br />

B<br />

1400 -<br />

1200 -<br />

1000 -<br />

800<br />

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\ , '.., . -<br />

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3.4. SPECTROSCOPY 65<br />

Figure 3.29. X-ray pho<strong>to</strong>electron spectrometer showing pho<strong>to</strong>ns hv generated by an X-ray tube<br />

incident on the specimen where they produce pho<strong>to</strong>electrons e- characteristic of the specimen<br />

material, which then traverse a velocity analyzer, and are brought <strong>to</strong> focus at an electron detec<strong>to</strong>r<br />

that measures their kinetic energy.<br />

439 441 443 445 447<br />

Binding Energy (eV)<br />

Figure 3.30. X-ray pho<strong>to</strong>electron spectra (XPS) of nanocrystalline InP showing (a) 39,, indium<br />

signal and (b) 2p phosphorus peaks. [From 0. Yitai, in Nalwa (2000), Vol. 1, Chapter 9, p. 427.1

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