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Introduction to Nanotechnology

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3.4. SPECTROSCOPY 59<br />

From Eq. (3.8) the frequency difference is given by lvinc - vemit) = In’ - n”Ivo = vo<br />

since the same infrared selection rule An = f l is obeyed. Two cases are observed:<br />

(1) vinc > vemit corresponding <strong>to</strong> a S<strong>to</strong>kes line, and (2) vine < vemit for an anti-S<strong>to</strong>kes<br />

line. Infrared active vibrational modes arise from a change in the electric dipole<br />

moment p of the molecule, while Raman-active vibrational modes involve a change<br />

in the polarizability P = pind/E, where the electric vec<strong>to</strong>r E of the incident light<br />

induces the dipole moment pind in the sample. Thus some vibrational modes are IRactive,<br />

that is, measurable by infrared spectroscopy, and some are Raman-active.<br />

Infrared and optical spectroscopy is often carried out by reflection, and the<br />

measurements of nanostructures provide the reflectance (or reflectivity) R, which is<br />

the fraction of reflected light. For normal incidence we have<br />

(3.10)<br />

where E is the dimensionless dielectric constant of the material. The dielectric<br />

constant E(V) has real and imaginary parts, E = E’(v) + ~ ”(v), where the real or<br />

dispersion part E’ provides the frequencies of the IR bands, and the imaginary part E”<br />

measures the energy absorption or loss. A technique called Kramers-Kronig<br />

analysis is used <strong>to</strong> extract the frequency dependences of E’(v) and ~”(v) from<br />

measured IR reflection spectra.<br />

The classical way <strong>to</strong> carry out infrared spectroscopy is <strong>to</strong> scan the frequency of<br />

the incoming light <strong>to</strong> enable the detec<strong>to</strong>r <strong>to</strong> record changes in the light intensity for<br />

those frequencies at which the sample absorbs energy. A major disadvantage of this<br />

method is that the detec<strong>to</strong>r records meaningful information only while the scan is<br />

passing through absorption lines, while most of the time is spent scanning between<br />

lines when the detec<strong>to</strong>r has nothing <strong>to</strong> record. To overcome this deficiency, modem<br />

infrared spectrometers irradiate the sample with a broad band of frequencies<br />

simultaneously, and then carry out a mathematical analysis of the resulting signal<br />

called a Fourier transformation <strong>to</strong> convert the detected signal back in<strong>to</strong> the classical<br />

form of the spectrum. The resulting signal is called a Fourier transform infrared<br />

(FTIR) spectrum. The Fourier transform technique is also widely used in nuclear<br />

magnetic resonance, discussed below, and in other branches of spectroscopy.<br />

Figure 3.23 presents an FTIR spectrum of silicon nitride (Si,N,) nanopowder<br />

showing the vibrational absorption lines corresponding <strong>to</strong> the presence of hydroxyl<br />

Si-OH, amino Si-”,, and imido Si-NH-Si groups on the surface. Figure 3.24<br />

shows a similar FTIR spectrum of silicon carbonitride nanopowder, (SiCN),<br />

revealing the presence of several chemical species on the surface after activation<br />

at 873 K, and their removal by heating for an hour under dry oxygen at 773 K.<br />

Figure 3.25 shows how the width of the Raman spectral lines of germanium<br />

nanocrystals embedded in SiO, thin films exhibit a pronounced broadening when the<br />

particle size decreases below about 20nm. Figure 3.26 shows a Raman spectrum<br />

recorded for germanium nanocrystals that arises from a distribution of particle sizes<br />

around an average value of 65 nm. These nanocrystals were prepared by chemical<br />

reduction, precipitation, and subsequent annealing of the phase Si,Ge,O,, and the

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