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Introduction to Nanotechnology

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54 METHODS OF MEASURING PROPERTIES<br />

P-<br />

‘FFgwe 3.17. Micrograph 01 3-nm-diameter (30-A) gold particles on a carbon subslrale taken<br />

with a scanning electrofi microscope. [From J. D. Verhoeven, chapter in Whan (1986). p. 497.1<br />

The varying magnetic fields in thc coil pairs 1; ,f; and j j,j; produce the smaIler<br />

deflections from points 1 <strong>to</strong> 1’ <strong>to</strong> I” shown in thc detail A insct. Thus the clectron<br />

beam scans repeatedly from left <strong>to</strong> right across the sample in a raster pattern that<br />

eventually covers tlic cntire r x I’ fnrne area on the sarnpIe. Figure 3.17 shows 3-nm<br />

gold particles on a carbon substratc rcsolved by an SEM.<br />

A scanning tunneling microscope utilizes a wire with a very fine point. This fine<br />

point is posirively charged and acts as a pmhc wkn It is lowered 60 a distance of<br />

about 1 nm above thc surface undcr study. Electrons at individual surface a<strong>to</strong>nis are<br />

attracted <strong>to</strong> the positive charge or the probe wire and jump (tunnel) up <strong>to</strong> it, thereby<br />

generating a weak clccrric current. The probe wire is scanned back and forth across<br />

the surface in a raskr partern. in cithes a constarif-height modc. or a constant-current<br />

mode. in the arrangements sketched in Fig. 3.1H. In the constant current mode a<br />

feedback loop mainrains a consttlnt probe height above the sample surfxc profile.<br />

and thc up/down pmbe variations are recordcd. This mode of operation aswnes a<br />

constant tunneling harrier across the surface. In Ihe constant-probe-height rnode the<br />

tip is constantly changing its distance from the surface. and this is reflected in<br />

variations of the recorded tunneling current as the probe scans. The feedback loop<br />

establishes the initinl pro& height, and is thcn turned off during the scan. The<br />

scanning pmbe probides a mapping of the distrihution of thc a<strong>to</strong>ms on the surface.<br />

Thc STM often employs a pie7oclectric Tripod scanner, and an early design of this<br />

scanner, built by Binning and Rohrer. is depicted in Fiy. 3. E9. A piezoclcctric is a<br />

material in which an applied voltage elicits a mechanical rcspnse, and thc reverse.<br />

Applicd voltages inducc piezo transducers <strong>to</strong> move the scanning prnhc (or the<br />

sarnplc) in nanornctcr increinenls along the x. y or z dircctions indicated on the arms<br />

(3) of the 3canner in the figure. The initial senin& is accomplished with thc aid of a<br />

stepper mo<strong>to</strong>r and micrometer screws. The tunneling currcnt. which varies expo-

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