26.04.2013 Views

Introduction to Nanotechnology

Introduction to Nanotechnology

Introduction to Nanotechnology

SHOW MORE
SHOW LESS

You also want an ePaper? Increase the reach of your titles

YUMPU automatically turns print PDFs into web optimized ePapers that Google loves.

60 METHODS OF MEASURING PROPERTIES<br />

0 (I)<br />

c<br />

t-0<br />

e<br />

5:<br />

2<br />

I I I I I<br />

4000 3500 3000 2500 2000 1500<br />

Wavenumber (cm-l)<br />

Figure 3.23. Fourier transform infrared spectrum of silicon nitride nanopowder recorded at room<br />

temperature under vacuum (tracing a) and after activation at 773 K (tracing b). (From G. Ramis,<br />

G. Busca, V. Lorenzelli, M.4. Bara<strong>to</strong>n, T. Merle-Mejean, and P. Quintard, in Surfaces and<br />

lnterfaces of Ceramic Materials. L. C. Dufour et al., eds., Kluwer Academic, Dordrecht, 1989,<br />

p. 173.)<br />

I<br />

(I)<br />

o a<br />

c<br />

t-0-<br />

e<br />

5:<br />

Si'p" Si-OH<br />

.n<br />

a triple bonded C=O<br />

t I I I I I<br />

4000 3500 3000 2500 2000 1500<br />

Wavenum ber (cm-1)<br />

Figure 3.24. Fourier transform infrared spectrum of silicon carbonitride nanopowder recorded<br />

after activation at 873 K (tracing a) and after subsequent heating in dry oxygen at 773 K for one<br />

hour (tracing b). [From M.4. Bara<strong>to</strong>n, in Nalwa (2000), Vol. 2, Chapter 2, p. 131; see also<br />

M.4. Bara<strong>to</strong>n, W. Chang, and B. H. Kear, J. fhys. Chem. 100, 16647 (1996).]

Hooray! Your file is uploaded and ready to be published.

Saved successfully!

Ooh no, something went wrong!