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Introduction to Nanotechnology

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3.2. STRUCTURE 39<br />

Figure 3.2. Two-dimensional cubic lattice showing projections of pairs of (1 10) and (1 20) planes<br />

(perpendicular <strong>to</strong> the surface) with the distances d between them indicated.<br />

so higher index planes have larger Bragg dimaction angles 8. Figure 3.2 shows the<br />

spacing d for 110 and 120 planes, where the index 2 = 0 corresponds <strong>to</strong> planes that<br />

are parallel <strong>to</strong> the z direction. It is clear from this figure that planes with higher<br />

indices are closer <strong>to</strong>gether, in accordance with Eq. (3.3), so they have larger Bragg<br />

angles 8 from Eq. (3.2). The amplitudes of the X-ray lines from different crystal-<br />

lographic planes also depend on the indices hkl, with some planes having zero<br />

amplitude, and these relative amplitudes help in identifying the structure type. For<br />

example, for a body-centered mona<strong>to</strong>mic lattice the only planes that produce<br />

observed diffraction peaks are those for which h + k + I = n, an even integer, and<br />

for a face-centered cubic lattice the only observed diffraction lines either have all<br />

odd integers or all even integers.<br />

To obtain a complete crystal structure, X-ray spectra are recorded for rotations<br />

around three mutually perpendicular planes of the crystal. This provides compre-<br />

hensive information on the various crystallographic planes of the lattice. The next<br />

step in the analysis is <strong>to</strong> convert these data on the planes <strong>to</strong> a knowledge of the<br />

positions of the a<strong>to</strong>ms in the unit cell. This can be done by a mathematical procedure<br />

called Fourier transformation. Carrying out this procedure permits us <strong>to</strong> identify<br />

which one of the 230 crystallographic space groups corresponds <strong>to</strong> the structure,<br />

<strong>to</strong>gether with providing the lengths of the lattice constants a,b,c of the unit cell, and<br />

the values of the angles cl,fl,y between them. In addition, the coordinates of the<br />

positions of each a<strong>to</strong>m in the unit cell can be deduced.<br />

As an example of an X-ray diffraction structure determination, consider the case<br />

of nanocrystalline titanium nitride prepared by chemical vapor deposition with the<br />

grain size distribution shown in Fig. 3.3. The X-ray diffraction scan, with the various<br />

lines labeled according <strong>to</strong> their crystallographic planes, is shown in Fig. 3.4. The fact<br />

that all the planes have either all odd or all even indices identifies the structure as<br />

face-centered cubic. The data show that TIN has the FCC NaCl structure sketched in<br />

Fig. 2.3c, with the lattice constant a = 0.42417nm.<br />

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