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Introduction to Nanotechnology

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2.3. LOCALIZED PARTICLES 31<br />

add electrons <strong>to</strong> the accep<strong>to</strong>rs are much less than the thermal energy at room<br />

temperature T = 300 K, that is, AED, AE, k,T, these traps are not extensively ionized, and the energies<br />

involved in exciting or ionizing them are not small. Examples of deep centers are<br />

defects associated with broken bonds, or strain involving displacements of a<strong>to</strong>ms. In<br />

Chapter 8 we discuss how deep centers can produce characteristic optical spectro-<br />

scopic effects.<br />

2.3.2. Mobility<br />

Another important parameter of a semiconduc<strong>to</strong>r is the mobility p or charge carrier<br />

drift velocity u per unit electric field E, given by the expression p = (ul/E. This<br />

parameter is defined as positive for both electrons and holes. Table B.9 lists the<br />

mobilities pe and p,, for electrons and holes, respectively, in the semiconduc<strong>to</strong>rs<br />

under consideration. The electrical conductivity (T is the sum of contributions from<br />

the concentrations of electrons n and of holes p in accordance with the expression<br />

where e is the electronic charge. The mobilities have a weak power-law temperature<br />

dependence T", and the pronounced T dependence of the conductivity is due<br />

principally <strong>to</strong> the dependence of the electron and hole concentrations on the tem-<br />

perature. In doped semiconduc<strong>to</strong>rs this generally arises mainly from the Boltzmann<br />

fac<strong>to</strong>r exp(-Ei/kBT) associated with the ionization energies Ei of the donors or<br />

accep<strong>to</strong>rs. Typical ionization energies for donors and accep<strong>to</strong>rs in Si and Ge listed in<br />

Table B. 10 are in the range from 0.0096 <strong>to</strong> 0.16 eV, which is much less than the<br />

bandgap energies 1.1 1 eV and 0.66 eV of Si and Ge, respectively. Figure 2.12 shows<br />

the locations of donor and accep<strong>to</strong>r levels on an energy band plot, and makes clear<br />

that their respective ionization energies are much less that Eg. The thermal energy<br />

kBT = 0.026 eV at room temperature (300 K) is often comparable <strong>to</strong> the ionization<br />

energies. In intrinsic or undoped materials the main contribution is from the<br />

exponential fac<strong>to</strong>r exp(-E,/2kBT) in the following expression from the law of<br />

mass action<br />

312<br />

ni =pi = 2($) (rnernh)3/4 exp- -EP<br />

2k~ T<br />

(2.15)<br />

where the intrinsic concentrations of electrons ni and holes pi are equal <strong>to</strong> each other<br />

because the thermal excitation of ni electrons <strong>to</strong> the conduction band leaves behind

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