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2Gb: x4, x8, x16 DDR3 SDRAM - Micron

2Gb: x4, x8, x16 DDR3 SDRAM - Micron

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Mode Register 2 (MR2)<br />

Figure 55: Mode Register 2 (MR2) Definition<br />

The mode register 2 (MR2) controls additional features and functions not available in<br />

the other mode registers. These addional functions are CAS WRITE latency (CWL), AU-<br />

TO SELF REFRESH (ASR), SELF REFRESH TEMPERATURE (SRT), and DYNAMIC ODT<br />

(R TT(WR)). These functions are controlled via the bits shown in the figure below. MR2 is<br />

programmed via the MRS command and will retain the stored information until it is<br />

programmed again or the device loses power. Reprogramming the MR2 register will not<br />

alter the contents of the memory array, provided it is reprogrammed correctly. The MR2<br />

register must be loaded when all banks are idle and no data bursts are in progress, and<br />

the controller must wait the specified time t MRD and t MOD before initiating a subsequent<br />

operation.<br />

M16 M15<br />

0 0<br />

0 1<br />

1 0<br />

1 1<br />

CAS WRITE Latency (CWL)<br />

Mode Register<br />

Mode register set 0 (MR0)<br />

Mode register set 1 (MR1)<br />

Mode register set 2 (MR2)<br />

Mode register set 3 (MR3)<br />

M10 M9<br />

0 0<br />

0 1<br />

1 0<br />

1 1<br />

BA2 BA1 BA0 A14 A13 A12 A11 A10 A9 A8 A7 A6 A5 A4 A3 A2 A1 A0<br />

15 14<br />

0 01 17 16<br />

0 1 1<br />

Dynamic ODT<br />

(R TT(WR) )<br />

RTT(WR) disabled<br />

RZQ/4 (60� NOM)<br />

RZQ/2 (120� NOM)<br />

Reserved<br />

13<br />

0 1<br />

12 11 10 9 8 7 6 5 4 3 2 1 0<br />

ASR CWL<br />

2<br />

01 01 01 01 01 01 RTT(WR) SRT<br />

M7 Self Refresh Temperature<br />

0 Normal (0°C to 85°C)<br />

1 Extended (0°C to 95°C)<br />

Auto Self Refresh<br />

M6 (Optional)<br />

0 Disabled: Manual<br />

1 Enabled: Automatic<br />

<strong>2Gb</strong>: <strong>x4</strong>, <strong>x8</strong>, <strong>x16</strong> <strong>DDR3</strong> <strong>SDRAM</strong><br />

Mode Register 2 (MR2)<br />

Address bus<br />

Mode register 2 (MR2)<br />

CAS Write Latency (CWL)<br />

5 CK ( tCK � 2.5ns)<br />

6 CK (2.5ns > tCK � 1.875ns)<br />

7 CK (1.875ns > tCK � 1.5ns)<br />

8 CK (1.5ns > tCK � 1.25ns)<br />

9 CK (1.25ns > tCK � 1.07ns)<br />

10 CK (1.071ns > t M5 M4 M3<br />

0 0 0<br />

0 0 1<br />

0 1 0<br />

0 1 1<br />

1 0 0<br />

1 0 1<br />

CK � 0.938ns)<br />

1 1 0<br />

Reserved<br />

1 1 1<br />

Reserved<br />

Notes: 1. MR2[17, 14:11, 8, and 2:0] are reserved for future use and must all be programmed to 0.<br />

2. On die revision A, ASR is not available; MR2[6] must be programmed to 0 and, if operating<br />

in self refresh mode above 85°C, MR2[7] (SRT) must be used.<br />

CAS write latency (CWL) is defined by MR2[5:3] and is the delay, in clock cycles, from<br />

the releasing of the internal write to the latching of the first data in. CWL must be correctly<br />

set to the corresponding operating clock frequency (see Figure 55). The overall<br />

WRITE latency (WL) is equal to CWL + AL (Figure 53 (page 139)).<br />

PDF: 09005aef826aaadc<br />

<strong>2Gb</strong>_<strong>DDR3</strong>_<strong>SDRAM</strong>.pdf – Rev. P 2/12 EN 143 <strong>Micron</strong> Technology, Inc. reserves the right to change products or specifications without notice.<br />

� 2006 <strong>Micron</strong> Technology, Inc. All rights reserved.

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