2Gb: x4, x8, x16 DDR3 SDRAM - Micron

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Figure 92: WRITE (BC4 OTF) to PRECHARGE CK# CK Command 1 Address 3 DQS, DQS# DQ 4 T0 T1 T2 T3 T4 T5 T6 T7 T8 T9 Tn WRITE NOP NOP NOP NOP NOP NOP NOP NOP NOP PRE Bank, Col n DQ Input Timing WL = 5 t WPRE DI n DI n + 1 DI n + 2 2Gb: x4, x8, x16 DDR3 SDRAM WRITE Operation DI n + 3 t WPST Indicates break in time scale Transitioning Data t WR 2 Valid Don’t Care Notes: 1. NOP commands are shown for ease of illustration; other commands may be valid at these times. 2. The write recovery time ( t WR) is referenced from the rising clock edge at T9. t WR specifies the last burst WRITE cycle until the PRECHARGE command can be issued to the same bank. 3. The BC4 setting is activated by MR0[1:0] = 01 and A12 = 0 during the WRITE command at T0. 4. DI n = data-in for column n. 5. BC4 (OTF), WL = 5, RL = 5. Figure 83 (page 170) shows the strobe-to-clock timing during a WRITE burst. DQS, DQS# must transition within 0.25tCK of the clock transitions, as limited by tDQSS. All data and data mask setup and hold timings are measured relative to the DQS, DQS# crossing, not the clock crossing. The WRITE preamble and postamble are also shown in Figure 83 (page 170). One clock prior to data input to the DRAM, DQS must be HIGH and DQS# must be LOW. Then for a half clock, DQS is driven LOW (DQS# is driven HIGH) during the WRITE preamble, tWPRE. Likewise, DQS must be kept LOW by the controller after the last data is written to the DRAM during the WRITE postamble, tWPST. Data setup and hold times are also shown in Figure 83 (page 170). All setup and hold times are measured from the crossing points of DQS and DQS#. These setup and hold values pertain to data input and data mask input. Additionally, the half period of the data input strobe is specified by tDQSH and tDQSL. PDF: 09005aef826aaadc 2Gb_DDR3_SDRAM.pdf – Rev. P 2/12 EN 176 Micron Technology, Inc. reserves the right to change products or specifications without notice. � 2006 Micron Technology, Inc. All rights reserved.
Figure 93: Data Input Timing DQS, DQS# DQ DM t WPRE DI b t DQSH t DQSL t t DH DS t t DH DS 2Gb: x4, x8, x16 DDR3 SDRAM WRITE Operation Transitioning Data t WPST Don’t Care PDF: 09005aef826aaadc 2Gb_DDR3_SDRAM.pdf – Rev. P 2/12 EN 177 Micron Technology, Inc. reserves the right to change products or specifications without notice. � 2006 Micron Technology, Inc. All rights reserved.
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DDR3 SDRAM MT41J512M4 - 64 Meg x 4
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2Gb: x4, x8, x16 DDR3 SDRAM Feature
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State Diagram Figure 2: Simplified
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2Gb: x4, x8, x16 DDR3 SDRAM Functio
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Figure 4: 256 Meg x 8 Functional Bl
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Figure 7: 96-Ball FBGA - x16 (Top V
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Table 3: 78-Ball FBGA - x4, x8 Ball
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Table 4: 96-Ball FBGA - x16 Ball De
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Figure 9: 78-Ball FBGA - x4, x8 (HX
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Figure 11: 96-Ball FBGA - x16 (JT)
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Input/Output Capacitance Table 6: D
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Figure 12: Thermal Measurement Poin
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Table 9: I DD0 Measurement Loop CK,
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2Gb: x4, x8, x16 DDR3 SDRAM Electri
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Table 14: I DD4R Measurement Loop C
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Table 16: I DD5B Measurement Loop C
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Table 18: I DD7 Measurement Loop CK
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Electrical Characteristics - I DD S
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Table 21: I DD Maximum Limits - Die
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Electrical Specifications - DC and
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Figure 13: Input Signal 0.925V 0.85
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Table 28: Differential Input Operat
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Figure 18: Definition of Differenti
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Figure 19: Nominal Slew Rate Defini
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ODT Characteristics Figure 21: ODT
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Table 33: R TT Effective Impedances
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Figure 23: t AON and t AOF Definiti
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Output Driver Impedance Figure 26:
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34 Ohm Driver The 34� driver’s
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Alternative 40 Ohm Driver Table 45:
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Output Characteristics and Operatin
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Figure 28: Differential Output Sign
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Slew Rate Definitions for Different
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Table 53: DDR3-1333 Speed Bins DDR3
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Table 55: DDR3-1866 Speed Bins DDR3
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PDF: 09005aef826aaadc Micron Techno
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2Gb: x4, x8, x16 DDR3 SDRAM Command
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Table 62: Derating Values for t IS/
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Figure 32: Nominal Slew Rate and t
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Figure 34: Tangent Line for t IS (C
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Data Setup, Hold, and Derating 2Gb:
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Table 68: Derating Values for t DS/
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2Gb: x4, x8, x16 DDR3 SDRAM Data Se
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Figure 37: Nominal Slew Rate for t
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Figure 39: Tangent Line for t DH (D
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2Gb: x4, x8, x16 DDR3 SDRAM Command
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Commands DESELECT NO OPERATION ZQ C
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PRECHARGE REFRESH 2Gb: x4, x8, x16
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DLL Disable Mode • All other self
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Figure 42: DLL Disable Mode to DLL
Page 125 and 126: Input Clock Frequency Change 2Gb: x
Page 127 and 128: Write Leveling Figure 45: Write Lev
Page 129 and 130: Write Leveling Procedure 2Gb: x4, x
Page 131 and 132: Write Leveling Mode Exit Procedure
Page 133 and 134: Figure 48: Initialization Sequence
Page 135 and 136: Figure 50: MRS to nonMRS Command Ti
Page 137 and 138: Table 77: Burst Order Burst Length
Page 139 and 140: Mode Register 1 (MR1) Figure 53: Mo
Page 141 and 142: On-Die Termination (ODT) WRITE LEVE
Page 143 and 144: Mode Register 2 (MR2) Figure 55: Mo
Page 145 and 146: SRT versus ASR 2Gb: x4, x8, x16 DDR
Page 147 and 148: Figure 58: MPR Block Diagram Memory
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Page 153 and 154: MPR Read Predefined Pattern The pre
Page 155 and 156: ACTIVATE Operation Before any READ
Page 157 and 158: READ Operation Figure 66: READ Late
Page 163 and 164: 2Gb: x4, x8, x16 DDR3 SDRAM READ Op
Page 165 and 166: Figure 77: Data Strobe Timing - REA
Page 167 and 168: Figure 80: t RPST Timing CK CK# DQS
Page 169 and 170: Figure 81: t WPRE Timing Figure 82:
Page 175: Figure 90: WRITE (BL8) to PRECHARGE
Page 179 and 180: Figure 94: Self Refresh Entry/Exit
Page 181 and 182: Power-Down Mode Power-down is synch
Page 183 and 184: Figure 95: Active Power-Down Entry
Page 185 and 186: Figure 98: Power-Down Entry After R
Page 187 and 188: Figure 102: ACTIVATE to Power-Down
Page 189 and 190: RESET Operation 2Gb: x4, x8, x16 DD
Page 191 and 192: On-Die Termination (ODT) Figure 107
Page 193 and 194: Dynamic ODT Dynamic ODT Special Use
Page 195 and 196: Table 89: Mode Registers for R TT(W
Page 199 and 200: Synchronous ODT Mode ODT Latency an
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2Gb: x4, x8, x16 DDR3 SDRAM - Micron

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