2Gb: x4, x8, x16 DDR3 SDRAM - Micron

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2Gb: x4, x8, x16 DDR3 SDRAM Electrical Characteristics and AC Operating Conditions 36. The refresh period is 64ms when TC is less than or equal to 85°C. This equates to an average refresh rate of 7.8125μs. However, nine REFRESH commands should be asserted at least once every 70.3μs. When TC is greater than 85°C, the refresh period is 32ms. 37. Although CKE is allowed to be registered LOW after a REFRESH command when tREFPDEN (MIN) is satisfied, there are cases where additional time such as tXPDLL (MIN) is required. 38. ODT turn-on time MIN is when the device leaves High-Z and ODT resistance begins to turn on. ODT turn-on time maximum is when the ODT resistance is fully on. The ODT reference load is shown in Figure 21 (page 55). Designs that were created prior to JEDEC tightening the maximum limit from 9ns to 8.5ns will be allowed to have a 9ns maximum. 39. Half-clock output parameters must be derated by the actual tERR10per and tJITdty when input clock jitter is present. This results in each parameter becoming larger. The parameters tADC (MIN) and tAOF (MIN) are each required to be derated by subtracting both tERR10per (MAX) and tJITdty (MAX). The parameters tADC (MAX) and tAOF (MAX) are required to be derated by subtracting both tERR10per (MAX) and tJITdty (MAX). 40. ODT turn-off time minimum is when the device starts to turn off ODT resistance. ODT turn-off time maximum is when the DRAM buffer is in High-Z. The ODT reference load is shown in Figure 22 (page 58). This output load is used for ODT timings (see Figure 29 (page 69)). 41. Pulse width of a input signal is defined as the width between the first crossing of VREF(DC) and the consecutive crossing of VREF(DC). 42. Should the clock rate be larger than tRFC (MIN), an AUTO REFRESH command should have at least one NOP command between it and another AUTO REFRESH command. Additionally, if the clock rate is slower than 40ns (25 MHz), all REFRESH commands should be followed by a PRECHARGE ALL command. 43. DRAM devices should be evenly addressed when being accessed. Disproportionate accesses to a particular row address may result in reduction of the product lifetime. 44. When two VIH(AC) values (and two corresponding VIL(AC) values) are listed for a specific speed bin, the user may choose either value for the input AC level. Whichever value is used, the associated setup time for that AC level must also be used. Additionally, one VIH(AC) value may be used for address/command inputs and the other VIH(AC) value may be used for data inputs. For example, for DDR3-800, two input AC levels are defined: V IH(AC175),min and V IH(AC150),min (corresponding V IL(AC175),min and V IL(AC150),min). For DDR3-800, the address/ command inputs must use either V IH(AC175),min with t IS(AC175) of 200ps or V IH(AC150),min with t IS(AC150) of 350ps; independently, the data inputs must use either V IH(AC175),min with t DS(AC175) of 75ps or V IH(AC150),min with t DS(AC150) of 125ps. PDF: 09005aef826aaadc 2Gb_DDR3_SDRAM.pdf – Rev. P 2/12 EN 96 Micron Technology, Inc. reserves the right to change products or specifications without notice. � 2006 Micron Technology, Inc. All rights reserved.
2Gb: x4, x8, x16 DDR3 SDRAM Command and Address Setup, Hold, and Derating Command and Address Setup, Hold, and Derating The total tIS (setup time) and tIH (hold time) required is calculated by adding the data sheet tIS (base) and tIH (base) values (see Table 59; values come from Table 57 (page 77)) to the �tIS and �tIH derating values (see Table 60 (page 98) and Table 61 (page 98)), respectively. Example: tIS (total setup time) = tIS (base) + �tIS. For a valid transition, the input signal has to remain above/below VIH(AC)/VIL(AC) for some time tVAC (see Table 61 (page 98)). Although the total setup time for slow slew rates might be negative (for example, a valid input signal will not have reached VIH(AC)/VIL(AC) at the time of the rising clock transition), a valid input signal is still required to complete the transition and to reach VIH(AC)/VIL(AC) (see Figure 13 (page 47) for input signal requirements). For slew rates that fall between the values listed in Table 61 (page 98) and Table 64 (page 100), the derating values may be obtained by linear interpolation. Setup ( tIS) nominal slew rate for a rising signal is defined as the slew rate between the last crossing of VREF(DC) and the first crossing of VIH(AC)min. Setup ( tIS) nominal slew rate for a falling signal is defined as the slew rate between the last crossing of VREF(DC) and the first crossing of VIL(AC)max. If the actual signal is always earlier than the nominal slew rate line between the shaded VREF(DC)-to-AC region, use the nominal slew rate for derating value (see Figure 32 (page 101)). If the actual signal is later than the nominal slew rate line anywhere between the shaded VREF(DC)-to-AC region, the slew rate of a tangent line to the actual signal from the AC level to the DC level is used for derating value (see Figure 34 (page 103)). Hold ( tIH) nominal slew rate for a rising signal is defined as the slew rate between the last crossing of VIL(DC)max and the first crossing of VREF(DC). Hold ( tIH) nominal slew rate for a falling signal is defined as the slew rate between the last crossing of VIH(DC)min and the first crossing of VREF(DC). If the actual signal is always later than the nominal slew rate line between the shaded DC-to-VREF(DC) region, use the nominal slew rate for derating value (see Figure 33 (page 102)). If the actual signal is earlier than the nominal slew rate line anywhere between the shaded DC-to-VREF(DC) region, the slew rate of a tangent line to the actual signal from the DC level to the VREF(DC) level is used for derating value (see Figure 35 (page 104)). Table 59: Command and Address Setup and Hold Values Referenced – AC/DC-Based Symbol 800 1066 1333 1600 1866 2133 Unit Reference tIS(base, AC175) 200 125 65 45 – – ps VIH(AC)/VIL(AC) t IS(base, AC150) 350 275 190 170 – – ps VIH(AC)/V IL(AC) t IS(base, AC135) – – – – 65 60 ps VIH(AC)/V IL(AC) t IS(base, AC125) – – – – 150 135 ps VIH(AC)/V IL(AC) t IH(base, DC100) 275 200 140 120 100 95 ps VIH(DC)/V IL(DC) PDF: 09005aef826aaadc 2Gb_DDR3_SDRAM.pdf – Rev. P 2/12 EN 97 Micron Technology, Inc. reserves the right to change products or specifications without notice. � 2006 Micron Technology, Inc. All rights reserved.
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DDR3 SDRAM MT41J512M4 - 64 Meg x 4
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2Gb: x4, x8, x16 DDR3 SDRAM Feature
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State Diagram Figure 2: Simplified
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2Gb: x4, x8, x16 DDR3 SDRAM Functio
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Figure 4: 256 Meg x 8 Functional Bl
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Figure 7: 96-Ball FBGA - x16 (Top V
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Table 3: 78-Ball FBGA - x4, x8 Ball
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Table 4: 96-Ball FBGA - x16 Ball De
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Figure 9: 78-Ball FBGA - x4, x8 (HX
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Figure 11: 96-Ball FBGA - x16 (JT)
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Input/Output Capacitance Table 6: D
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Figure 12: Thermal Measurement Poin
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Table 9: I DD0 Measurement Loop CK,
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2Gb: x4, x8, x16 DDR3 SDRAM Electri
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Table 14: I DD4R Measurement Loop C
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Table 16: I DD5B Measurement Loop C
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Table 18: I DD7 Measurement Loop CK
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Electrical Characteristics - I DD S
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Table 21: I DD Maximum Limits - Die
Page 45 and 46: Electrical Specifications - DC and
Page 47 and 48: Figure 13: Input Signal 0.925V 0.85
Page 49 and 50: Table 28: Differential Input Operat
Page 51 and 52: Figure 18: Definition of Differenti
Page 53 and 54: Figure 19: Nominal Slew Rate Defini
Page 55 and 56: ODT Characteristics Figure 21: ODT
Page 57 and 58: Table 33: R TT Effective Impedances
Page 59 and 60: Figure 23: t AON and t AOF Definiti
Page 61 and 62: Output Driver Impedance Figure 26:
Page 63 and 64: 34 Ohm Driver The 34� driver’s
Page 65 and 66: Alternative 40 Ohm Driver Table 45:
Page 67 and 68: Output Characteristics and Operatin
Page 69 and 70: Figure 28: Differential Output Sign
Page 71 and 72: Slew Rate Definitions for Different
Page 73 and 74: Table 53: DDR3-1333 Speed Bins DDR3
Page 75 and 76: Table 55: DDR3-1866 Speed Bins DDR3
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Page 99 and 100: Table 62: Derating Values for t IS/
Page 101 and 102: Figure 32: Nominal Slew Rate and t
Page 103 and 104: Figure 34: Tangent Line for t IS (C
Page 105 and 106: Data Setup, Hold, and Derating 2Gb:
Page 107 and 108: Table 68: Derating Values for t DS/
Page 109 and 110: 2Gb: x4, x8, x16 DDR3 SDRAM Data Se
Page 111 and 112: Figure 37: Nominal Slew Rate for t
Page 113 and 114: Figure 39: Tangent Line for t DH (D
Page 115 and 116: 2Gb: x4, x8, x16 DDR3 SDRAM Command
Page 117 and 118: Commands DESELECT NO OPERATION ZQ C
Page 119 and 120: PRECHARGE REFRESH 2Gb: x4, x8, x16
Page 121 and 122: DLL Disable Mode • All other self
Page 123 and 124: Figure 42: DLL Disable Mode to DLL
Page 125 and 126: Input Clock Frequency Change 2Gb: x
Page 127 and 128: Write Leveling Figure 45: Write Lev
Page 129 and 130: Write Leveling Procedure 2Gb: x4, x
Page 131 and 132: Write Leveling Mode Exit Procedure
Page 133 and 134: Figure 48: Initialization Sequence
Page 135 and 136: Figure 50: MRS to nonMRS Command Ti
Page 137 and 138: Table 77: Burst Order Burst Length
Page 139 and 140: Mode Register 1 (MR1) Figure 53: Mo
Page 141 and 142: On-Die Termination (ODT) WRITE LEVE
Page 143 and 144: Mode Register 2 (MR2) Figure 55: Mo
Page 145 and 146: SRT versus ASR 2Gb: x4, x8, x16 DDR
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Figure 58: MPR Block Diagram Memory
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PDF: 09005aef826aaadc Micron Techno
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MPR Read Predefined Pattern The pre
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ACTIVATE Operation Before any READ
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READ Operation Figure 66: READ Late
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2Gb: x4, x8, x16 DDR3 SDRAM READ Op
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Figure 77: Data Strobe Timing - REA
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Figure 80: t RPST Timing CK CK# DQS
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Figure 81: t WPRE Timing Figure 82:
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Figure 90: WRITE (BL8) to PRECHARGE
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Figure 93: Data Input Timing DQS, D
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Figure 94: Self Refresh Entry/Exit
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Power-Down Mode Power-down is synch
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Figure 95: Active Power-Down Entry
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Figure 98: Power-Down Entry After R
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Figure 102: ACTIVATE to Power-Down
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RESET Operation 2Gb: x4, x8, x16 DD
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On-Die Termination (ODT) Figure 107
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Dynamic ODT Dynamic ODT Special Use
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Table 89: Mode Registers for R TT(W
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Synchronous ODT Mode ODT Latency an
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2Gb: x4, x8, x16 DDR3 SDRAM - Micron

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