2Gb: x4, x8, x16 DDR3 SDRAM - Micron

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ZQ CALIBRATION Operation The ZQ CALIBRATION command is used to calibrate the DRAM output drivers (RON) and ODT values (RTT) over process, voltage, and temperature, provided a dedicated 240��(±1%) external resistor is connected from the DRAM’s ZQ ball to VSSQ. DDR3 SDRAM require a longer time to calibrate RON and ODT at power-up initialization and self refresh exit, and a relatively shorter time to perform periodic calibrations. DDR3 SDRAM defines two ZQ CALIBRATION commands: ZQCL and ZQCS. An example of ZQ calibration timing is shown below. All banks must be precharged and tRP must be met before ZQCL or ZQCS commands can be issued to the DRAM. No other activities (other than issuing another ZQCL or ZQCS command) can be performed on the DRAM channel by the controller for the duration of tZQinit or tZQoper. The quiet time on the DRAM channel helps accurately calibrate RON and ODT. After DRAM calibration is achieved, the DRAM should disable the ZQ ball’s current consumption path to reduce power. ZQ CALIBRATION commands can be issued in parallel to DLL RESET and locking time. Upon self refresh exit, an explicit ZQCL is required if ZQ calibration is desired. In dual-rank systems that share the ZQ resistor between devices, the controller must not enable overlap of tZQinit, tZQoper, or tZQCS between ranks. Figure 63: ZQ CALIBRATION Timing (ZQCL and ZQCS) CK# CK Command T0 T1 Ta0 Ta1 Ta2 Ta3 Tb0 Tb1 Tc0 Tc1 Tc2 ZQCL NOP NOP NOP Valid Valid ZQCS NOP NOP NOP Valid Address Valid Valid Valid A10 Valid Valid Valid CKE 1 Valid Valid 1 Valid ODT 2 Valid Valid 2 Valid DQ 3 High-Z Activities 3 High-Z t ZQinit or t ZQoper 2Gb: x4, x8, x16 DDR3 SDRAM ZQ CALIBRATION Operation t ZQCS Indicates break in time scale Activities Don’t Care Notes: 1. CKE must be continuously registered HIGH during the calibration procedure. 2. ODT must be disabled via the ODT signal or the MRS during the calibration procedure. 3. All devices connected to the DQ bus should be High-Z during calibration. PDF: 09005aef826aaadc 2Gb_DDR3_SDRAM.pdf – Rev. P 2/12 EN 154 Micron Technology, Inc. reserves the right to change products or specifications without notice. � 2006 Micron Technology, Inc. All rights reserved.
ACTIVATE Operation Before any READ or WRITE commands can be issued to a bank within the DRAM, a row in that bank must be opened (activated). This is accomplished via the ACTIVATE command, which selects both the bank and the row to be activated. After a row is opened with an ACTIVATE command, a READ or WRITE command may be issued to that row, subject to the tRCD specification. However, if the additive latency is programmed correctly, a READ or WRITE command may be issued prior to tRCD (MIN). In this operation, the DRAM enables a READ or WRITE command to be issued after the ACTIVATE command for that bank, but prior to tRCD (MIN) with the requirement that (ACTIVATE-to-READ/WRITE) + AL � tRCD (MIN) (see Posted CAS Additive Latency). tRCD (MIN) should be divided by the clock period and rounded up to the next whole number to determine the earliest clock edge after the ACTIVATE command on which a READ or WRITE command can be entered. The same procedure is used to convert other specification limits from time units to clock cycles. When at least one bank is open, any READ-to-READ command delay or WRITE-to- WRITE command delay is restricted to tCCD (MIN). A subsequent ACTIVATE command to a different row in the same bank can only be issued after the previous active row has been closed (precharged). The minimum time interval between successive ACTIVATE commands to the same bank is defined by tRC. A subsequent ACTIVATE command to another bank can be issued while the first bank is being accessed, which results in a reduction of total row-access overhead. The minimum time interval between successive ACTIVATE commands to different banks is defined by tRRD. No more than four bank ACTIVATE commands may be issued in a given tFAW (MIN) period, and the tRRD (MIN) restriction still applies. The tFAW (MIN) parameter applies, regardless of the number of banks already opened or closed. Figure 64: Example: Meeting t RRD (MIN) and t RCD (MIN) CK# CK Command Address BA[2:0] T0 T1 T2 T3 T4 T5 T8 T9 ACT NOP NOP ACT NOP NOP NOP NOP NOP RD/WR Row Row Col Bank x Bank y Bank y t RRD 2Gb: x4, x8, x16 DDR3 SDRAM ACTIVATE Operation t RCD Indicates break in time scale T10 T11 Don’t Care PDF: 09005aef826aaadc 2Gb_DDR3_SDRAM.pdf – Rev. P 2/12 EN 155 Micron Technology, Inc. reserves the right to change products or specifications without notice. � 2006 Micron Technology, Inc. All rights reserved.
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DDR3 SDRAM MT41J512M4 - 64 Meg x 4
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2Gb: x4, x8, x16 DDR3 SDRAM Feature
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State Diagram Figure 2: Simplified
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2Gb: x4, x8, x16 DDR3 SDRAM Functio
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Figure 4: 256 Meg x 8 Functional Bl
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Figure 7: 96-Ball FBGA - x16 (Top V
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Table 3: 78-Ball FBGA - x4, x8 Ball
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Table 4: 96-Ball FBGA - x16 Ball De
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Figure 9: 78-Ball FBGA - x4, x8 (HX
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Figure 11: 96-Ball FBGA - x16 (JT)
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Input/Output Capacitance Table 6: D
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Figure 12: Thermal Measurement Poin
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Table 9: I DD0 Measurement Loop CK,
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2Gb: x4, x8, x16 DDR3 SDRAM Electri
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Table 14: I DD4R Measurement Loop C
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Table 16: I DD5B Measurement Loop C
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Table 18: I DD7 Measurement Loop CK
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Electrical Characteristics - I DD S
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Table 21: I DD Maximum Limits - Die
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Electrical Specifications - DC and
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Figure 13: Input Signal 0.925V 0.85
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Table 28: Differential Input Operat
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Figure 18: Definition of Differenti
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Figure 19: Nominal Slew Rate Defini
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ODT Characteristics Figure 21: ODT
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Table 33: R TT Effective Impedances
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Figure 23: t AON and t AOF Definiti
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Output Driver Impedance Figure 26:
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34 Ohm Driver The 34� driver’s
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Alternative 40 Ohm Driver Table 45:
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Output Characteristics and Operatin
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Figure 28: Differential Output Sign
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Slew Rate Definitions for Different
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Table 53: DDR3-1333 Speed Bins DDR3
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Table 55: DDR3-1866 Speed Bins DDR3
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PDF: 09005aef826aaadc Micron Techno
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2Gb: x4, x8, x16 DDR3 SDRAM Command
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Table 62: Derating Values for t IS/
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Figure 32: Nominal Slew Rate and t
Page 103 and 104: Figure 34: Tangent Line for t IS (C
Page 105 and 106: Data Setup, Hold, and Derating 2Gb:
Page 107 and 108: Table 68: Derating Values for t DS/
Page 109 and 110: 2Gb: x4, x8, x16 DDR3 SDRAM Data Se
Page 111 and 112: Figure 37: Nominal Slew Rate for t
Page 113 and 114: Figure 39: Tangent Line for t DH (D
Page 115 and 116: 2Gb: x4, x8, x16 DDR3 SDRAM Command
Page 117 and 118: Commands DESELECT NO OPERATION ZQ C
Page 119 and 120: PRECHARGE REFRESH 2Gb: x4, x8, x16
Page 121 and 122: DLL Disable Mode • All other self
Page 123 and 124: Figure 42: DLL Disable Mode to DLL
Page 125 and 126: Input Clock Frequency Change 2Gb: x
Page 127 and 128: Write Leveling Figure 45: Write Lev
Page 129 and 130: Write Leveling Procedure 2Gb: x4, x
Page 131 and 132: Write Leveling Mode Exit Procedure
Page 133 and 134: Figure 48: Initialization Sequence
Page 135 and 136: Figure 50: MRS to nonMRS Command Ti
Page 137 and 138: Table 77: Burst Order Burst Length
Page 139 and 140: Mode Register 1 (MR1) Figure 53: Mo
Page 141 and 142: On-Die Termination (ODT) WRITE LEVE
Page 143 and 144: Mode Register 2 (MR2) Figure 55: Mo
Page 145 and 146: SRT versus ASR 2Gb: x4, x8, x16 DDR
Page 147 and 148: Figure 58: MPR Block Diagram Memory
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Page 153: MPR Read Predefined Pattern The pre
Page 157 and 158: READ Operation Figure 66: READ Late
Page 163 and 164: 2Gb: x4, x8, x16 DDR3 SDRAM READ Op
Page 165 and 166: Figure 77: Data Strobe Timing - REA
Page 167 and 168: Figure 80: t RPST Timing CK CK# DQS
Page 169 and 170: Figure 81: t WPRE Timing Figure 82:
Page 175 and 176: Figure 90: WRITE (BL8) to PRECHARGE
Page 177 and 178: Figure 93: Data Input Timing DQS, D
Page 179 and 180: Figure 94: Self Refresh Entry/Exit
Page 181 and 182: Power-Down Mode Power-down is synch
Page 183 and 184: Figure 95: Active Power-Down Entry
Page 185 and 186: Figure 98: Power-Down Entry After R
Page 187 and 188: Figure 102: ACTIVATE to Power-Down
Page 189 and 190: RESET Operation 2Gb: x4, x8, x16 DD
Page 191 and 192: On-Die Termination (ODT) Figure 107
Page 193 and 194: Dynamic ODT Dynamic ODT Special Use
Page 195 and 196: Table 89: Mode Registers for R TT(W
Page 199 and 200: Synchronous ODT Mode ODT Latency an
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2Gb: x4, x8, x16 DDR3 SDRAM - Micron

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