2Gb: x4, x8, x16 DDR3 SDRAM - Micron
2Gb: x4, x8, x16 DDR3 SDRAM - Micron
2Gb: x4, x8, x16 DDR3 SDRAM - Micron
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Output Characteristics and Operating Conditions<br />
The DRAM uses both single-ended and differential output drivers. The single-ended<br />
output driver is summarized below, while the differential output driver is summarized<br />
in Table 49 (page 68).<br />
Table 48: Single-Ended Output Driver Characteristics<br />
<strong>2Gb</strong>: <strong>x4</strong>, <strong>x8</strong>, <strong>x16</strong> <strong>DDR3</strong> <strong>SDRAM</strong><br />
Output Characteristics and Operating Conditions<br />
All voltages are referenced to VSS Parameter/Condition Symbol Min Max Unit Notes<br />
Output leakage current: DQ are disabled;<br />
0V � VOUT � VDDQ; ODT is disabled; ODT is HIGH<br />
IOZ –5 5 μA 1<br />
Output slew rate: Single-ended; For rising and falling edges,<br />
measure between VOL(AC) = VREF - 0.1 × VDDQ and VOH(AC) =<br />
VREF + 0.1 × VDDQ SRQse 2.5 6 V/ns 1, 2, 3, 4<br />
Single-ended DC high-level output voltage VOH(DC) 0.8 × VDDQ V 1, 2, 5<br />
Single-ended DC mid-point level output voltage VOM(DC) 0.5 × VDDQ V 1, 2, 5<br />
Single-ended DC low-level output voltage VOL(DC) 0.2 × VDDQ V 1, 2, 5<br />
Single-ended AC high-level output voltage VOH(AC) VTT + 0.1 × VDDQ V 1, 2, 3, 6<br />
Single-ended AC low-level output voltage VOL(AC) VTT - 0.1 × VDDQ V 1, 2, 3, 6<br />
Delta RON between pull-up and pull-down for DQ/DQS MMPUPD –10 10 % 1, 7<br />
Test load for AC timing and output slew rates Output to VTT (VDDQ/2) via 25� resistor 3<br />
Notes: 1. RZQ of 240��±1% with RZQ/7 enabled (default 34� driver) and is applicable after proper<br />
ZQ calibration has been performed at a stable temperature and voltage (V DDQ = V DD;<br />
V SSQ = V SS).<br />
2. V TT = V DDQ/2.<br />
3. See Figure 29 (page 69) for the test load configuration.<br />
4. The 6 V/ns maximum is applicable for a single DQ signal when it is switching either from<br />
HIGH to LOW or LOW to HIGH while the remaining DQ signals in the same byte lane are<br />
either all static or all switching in the opposite direction. For all other DQ signal switching<br />
combinations, the maximum limit of 6 V/ns is reduced to 5 V/ns.<br />
5. See Table 38 (page 62) for IV curve linearity. Do not use AC test load.<br />
6. See Table 50 (page 70) for output slew rate.<br />
7. See Table 38 (page 62) for additional information.<br />
8. See Figure 27 (page 68) for an example of a single-ended output signal.<br />
PDF: 09005aef826aaadc<br />
<strong>2Gb</strong>_<strong>DDR3</strong>_<strong>SDRAM</strong>.pdf – Rev. P 2/12 EN 67 <strong>Micron</strong> Technology, Inc. reserves the right to change products or specifications without notice.<br />
� 2006 <strong>Micron</strong> Technology, Inc. All rights reserved.