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2Gb: x4, x8, x16 DDR3 SDRAM - Micron

2Gb: x4, x8, x16 DDR3 SDRAM - Micron

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Output Characteristics and Operating Conditions<br />

The DRAM uses both single-ended and differential output drivers. The single-ended<br />

output driver is summarized below, while the differential output driver is summarized<br />

in Table 49 (page 68).<br />

Table 48: Single-Ended Output Driver Characteristics<br />

<strong>2Gb</strong>: <strong>x4</strong>, <strong>x8</strong>, <strong>x16</strong> <strong>DDR3</strong> <strong>SDRAM</strong><br />

Output Characteristics and Operating Conditions<br />

All voltages are referenced to VSS Parameter/Condition Symbol Min Max Unit Notes<br />

Output leakage current: DQ are disabled;<br />

0V � VOUT � VDDQ; ODT is disabled; ODT is HIGH<br />

IOZ –5 5 μA 1<br />

Output slew rate: Single-ended; For rising and falling edges,<br />

measure between VOL(AC) = VREF - 0.1 × VDDQ and VOH(AC) =<br />

VREF + 0.1 × VDDQ SRQse 2.5 6 V/ns 1, 2, 3, 4<br />

Single-ended DC high-level output voltage VOH(DC) 0.8 × VDDQ V 1, 2, 5<br />

Single-ended DC mid-point level output voltage VOM(DC) 0.5 × VDDQ V 1, 2, 5<br />

Single-ended DC low-level output voltage VOL(DC) 0.2 × VDDQ V 1, 2, 5<br />

Single-ended AC high-level output voltage VOH(AC) VTT + 0.1 × VDDQ V 1, 2, 3, 6<br />

Single-ended AC low-level output voltage VOL(AC) VTT - 0.1 × VDDQ V 1, 2, 3, 6<br />

Delta RON between pull-up and pull-down for DQ/DQS MMPUPD –10 10 % 1, 7<br />

Test load for AC timing and output slew rates Output to VTT (VDDQ/2) via 25� resistor 3<br />

Notes: 1. RZQ of 240��±1% with RZQ/7 enabled (default 34� driver) and is applicable after proper<br />

ZQ calibration has been performed at a stable temperature and voltage (V DDQ = V DD;<br />

V SSQ = V SS).<br />

2. V TT = V DDQ/2.<br />

3. See Figure 29 (page 69) for the test load configuration.<br />

4. The 6 V/ns maximum is applicable for a single DQ signal when it is switching either from<br />

HIGH to LOW or LOW to HIGH while the remaining DQ signals in the same byte lane are<br />

either all static or all switching in the opposite direction. For all other DQ signal switching<br />

combinations, the maximum limit of 6 V/ns is reduced to 5 V/ns.<br />

5. See Table 38 (page 62) for IV curve linearity. Do not use AC test load.<br />

6. See Table 50 (page 70) for output slew rate.<br />

7. See Table 38 (page 62) for additional information.<br />

8. See Figure 27 (page 68) for an example of a single-ended output signal.<br />

PDF: 09005aef826aaadc<br />

<strong>2Gb</strong>_<strong>DDR3</strong>_<strong>SDRAM</strong>.pdf – Rev. P 2/12 EN 67 <strong>Micron</strong> Technology, Inc. reserves the right to change products or specifications without notice.<br />

� 2006 <strong>Micron</strong> Technology, Inc. All rights reserved.

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