3D Time-of-flight distance measurement with custom - Universität ...

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DEMODULATION PIXELS IN CMOS/CCD 143 Signal-to-noise ratio SNR: ⎛ voltage swing in V SNR = 20 ⋅ log⎜ ⎝ rms noise of voltage swing in Dynamic range D/R: V ⎞ ⎟ ⎠ Equation 5.3 ⎛ maximum voltage swing in V ⎞ D / R = 20 ⋅ log⎜ ⎟ Equation 5.4 ⎝ floor noise in V ⎠ Table 5.4 summarizes the measured noise performance, SNR and D/R of the BCCD realization of the demodulation pixel. The additional noise of the analog electronics of the camera board and the frame grabber is only 54 µV rms and can be neglected. Fixed pattern noise: 38 mV Noise floor: 0.60 mV Dark noise (12.5 ms): 0.63 mV=175 electrons Bright noise (12.5 ms, 9000 fW): 3 mV Voltage swing (9000 fW): 1100 mV Maximum voltage swing: 3000 mV Signal-to-noise ratio SNR: 50 dB Dynamic range D/R: 73 dB Table 5.4 Noise performance of buried channel 1-tap demodulation pixel. Integration time for the bright noise measurement: 12.5 ms. 5.2.8 Comparison of measured distance accuracy with theory With the knowledge of the dark noise, we can now estimate the range accuracy of the demodulation pixels by means of Equation 4.16. The demodulation contrast at 20 MHz is Cdemod=40%, the modulation depth of the LEDs about Cmod=100%. The dark noise of 0.63 mV and 175 noise-equivalent electrons results in a number of Npseudo=30,000 pseudo electrons. The measurements have been performed under the microscope without additional background illumination. The results are illustrated in Figure 5.25.
144 CHAPTER 5 #Pseudo background electrons (floor noise): 30’000 Modulation depth of the LEDs Cmod: 1 Demodulation contrast Cdemod: 0.4 “L” (Non-ambiguity distance range): 750cm Optical mean power in fW: 9150 2500 750 200 50 Resulting #photoelectrons PEopt: 235000 64000 19000 5100 1300 Sigma in cm (theory): 0.7 1.6 3.9 12.2 45.1 Sigma in cm (measured): 1.6 1.6 3.8 13.1 55.3 These results are also plotted in the following graph and referenced in Section 5.2.6. Resolution in cm 20 15 10 5 0 Measurement Theory 0 2500 5000 7500 10000 Optical power in fW per pixel Figure 5.25 Estimated and measured distance resolution versus received optical power per pixel. (Integration time: 12.5 ms per sampling point, total 50 ms.) This excellent fit between measurement and theory confirms the validity of Equation 4.16, which gives us the possibility to predict the range accuracy for given measurement conditions.
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3D Time-of-flight distance measurem
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To my parents
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Meinen Eltern
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II 4. Power budget and resolution l
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Abstract Since we are living in a t
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centimeter accuracy. With the singl
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X Eine elegantere Methode zur Entfe
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INTRODUCTION 1 1. Introduction One
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INTRODUCTION 3 light source observe
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INTRODUCTION 5 Propagation time, ho
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INTRODUCTION 7 Chapter 3 gives a sh
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OPTICAL TOF RANGE MEASUREMENT 9 2.
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OPTICAL TOF RANGE MEASUREMENT 13 pr
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OPTICAL TOF RANGE MEASUREMENT 15 hi
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OPTICAL TOF RANGE MEASUREMENT 17 Pu
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OPTICAL TOF RANGE MEASUREMENT 23 wh
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OPTICAL TOF RANGE MEASUREMENT 25 δ
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OPTICAL TOF RANGE MEASUREMENT 27 c(
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OPTICAL TOF RANGE MEASUREMENT 29 A
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OPTICAL TOF RANGE MEASUREMENT 31 ph
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OPTICAL TOF RANGE MEASUREMENT 33 Ts
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OPTICAL TOF RANGE MEASUREMENT 35 f1
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OPTICAL TOF RANGE MEASUREMENT 37 an
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OPTICAL TOF RANGE MEASUREMENT 41 Ss
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OPTICAL TOF RANGE MEASUREMENT 43 Fr
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OPTICAL TOF RANGE MEASUREMENT 45 1
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50 CHAPTER 3 the smearing effect, r
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52 CHAPTER 3 3.1 Silicon properties
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54 CHAPTER 3 (a) Figure 3.3 Optical
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56 CHAPTER 3 Quantum efficiency in
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58 CHAPTER 3 The different operatio
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60 CHAPTER 3 (a) (b) Depletion widt
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62 CHAPTER 3 Very special processes
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64 CHAPTER 3 1 kT Dn = ⋅ vth ⋅
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66 CHAPTER 3 The proportionality fa
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68 CHAPTER 3 difference of only 1 V
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70 CHAPTER 3 Flicker noise is cause
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72 CHAPTER 3 A s = sf ⋅ q C ⎡ V
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74 CHAPTER 3 amount of the charge p
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76 CHAPTER 3 substrate (Equation 3.
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78 CHAPTER 3 charge carriers the CT
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80 CHAPTER 3 without causing short
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82 CHAPTER 3 Over an address decode
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84 CHAPTER 3 Orbit’s 2.0µm CMOS/
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86 CHAPTER 4 Figure 4.1 P lens Lamb
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88 CHAPTER 4 Required optical power
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90 CHAPTER 4 4.2 Noise limitation o
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194 CHAPTER 8 MCD06S: Measurement c
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196 [BRK] Brockhaus, “Naturwissen
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198 [KAI] I. Kaisto, et al., “Opt
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200 [SP1] T. Spirig et al., “The
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ACKNOWLEDGMENTS 203 Acknowledgments
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206 Publication list 1. R. Lange, P
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