22.01.2013 Views

3D Time-of-flight distance measurement with custom - Universität ...

3D Time-of-flight distance measurement with custom - Universität ...

3D Time-of-flight distance measurement with custom - Universität ...

SHOW MORE
SHOW LESS

You also want an ePaper? Increase the reach of your titles

YUMPU automatically turns print PDFs into web optimized ePapers that Google loves.

REFERENCES 197<br />

[FUR] M. Furumiya et al., “A ½-inch 1.3N-Pixel Progressive Scan CCD Image<br />

Sensor Employing 0.25 mm Gap Single-Layer Poly-Si Electrodes",<br />

Proceedings <strong>of</strong> IEEE International Solid-State Circuits Conference, San<br />

Francisco, (1999).<br />

[HAM] Hamamatsu prospectus, “Image Intensifiers”, (1994).<br />

[HAU] F. Hauser, “Internship at CSEM Zurich”, CSEM-internal report, (2000).<br />

[HEC] E. Hecht, A.Zajac, “OPTICS”, Addison-Wesley, (1974).<br />

[HEK] P. Heck, “Operation and characterization <strong>of</strong> a surface channel CCD-line”,<br />

Diploma work (Travail pratique de Diplôme), EPFL Lausanne/ CSEM<br />

Zurich, (1999).<br />

[HOF] B. H<strong>of</strong>fmann, “Einsteins Ideen”, Spektrum Akademischer Verlag, 1997;<br />

Translation <strong>of</strong>: “Relativity and Its Roots“, Scientific American Books, New<br />

York, (1983).<br />

[HOP] C. R. Hoople et al., “Characteristics <strong>of</strong> Submicrometer Gaps in Buried-<br />

Channel CCD Structures”, IEEE Transactions on electron devices, Vol. 38,<br />

No. 5, (1991).<br />

[HOP] G. Hopkinson, et al. “Noise reduction techniques for CCD image sensors”,<br />

J. Phys. E : Sci. Instrum., Vol. 15, pp. 1214-1222, (1982).<br />

[HP1] Hewlett Packard (now Agilent), “Super Flux LEDs, Technical Data”, Data<br />

sheet <strong>of</strong> HP SunPower Series, including HPWT-DH00, (1998).<br />

[HP2] Hewlett Packard (now Agilent), “Super Flux LED, Categories and Labels”,<br />

Application Note 1149-7, (1998).<br />

[JE1] G. Jellison et al. “Optical functions <strong>of</strong> silicon at elevated temperatures”,<br />

Journal <strong>of</strong> Applied Physics, 76, (1994).<br />

[JE2] G. Jellison, “Optical functions <strong>of</strong> silicon determined by two-channel<br />

polarization modulation ellipsometry”, North-Holland Physics Publishing,<br />

Optical Materials 1, pp. 41-47, (1992).<br />

[KA2] H. A. Kappner, “Verfahren und Anordnung zur dreidimensionalen<br />

optischen Erfassung von Objekten”, European Patent No. 0 192 993 A1,<br />

(1986).

Hooray! Your file is uploaded and ready to be published.

Saved successfully!

Ooh no, something went wrong!