3D Time-of-flight distance measurement with custom - Universität ...
3D Time-of-flight distance measurement with custom - Universität ...
3D Time-of-flight distance measurement with custom - Universität ...
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SOLID-STATE IMAGE SENSING 63<br />
transport if many free charge carriers are located close to each other. We will see<br />
later that for typical optical conditions in our TOF application, we deal <strong>with</strong> the<br />
transportation <strong>of</strong> single electrons. Therefore, self-induced drift is neglected.<br />
Self induced drift Thermal diffusion<br />
E<br />
Electric field<br />
Figure 3.11 Transport mechanisms for free electrons in a semiconductor.<br />
Thermal diffusion<br />
For temperatures larger than T=0°K, free charge carriers have thermal energy,<br />
which results in a permanent movement in random directions. The thermal velocity<br />
vth, i.e. the amount <strong>of</strong> the microscopic movement velocity, is given by:<br />
3kT<br />
v th =<br />
m<br />
Equation 3.6<br />
eff<br />
At room temperature (300K) we get vth≈10 7 cm/s for Si and GaAs. The charge<br />
carriers move fairly quickly but steadily change their directions due to collisions <strong>with</strong><br />
the fixed lattice or impurity atoms or other free charge carriers. The sum <strong>of</strong> these<br />
microscopic movements results in a macroscopic movement, again in random<br />
directions. This movement process, known as thermal diffusion, only ends when the<br />
free carriers recombine after a certain lifetime τn and τp respectively. Statistically<br />
speaking, after this time they have traveled a certain <strong>distance</strong>, the so-called<br />
diffusion length Ln:<br />
Ln<br />
= Dn<br />
⋅ τn<br />
Equation 3.7<br />
This diffusion length depends on the doping concentration <strong>of</strong> the semiconductor.<br />
This is expressed in the diffusivity Dn, which contains the doping dependent carrier<br />
mobility (electron mobility µn):