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3D Time-of-flight distance measurement with custom - Universität ...

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SOLID-STATE IMAGE SENSING 55<br />

For light <strong>of</strong> long wavelength a large number <strong>of</strong> electron-hole pairs is generated far<br />

from the depletion region in the semiconductor bulk. After their generation, these<br />

charge carriers move by diffusion in random directions. The further away from the<br />

surface they have been generated, the higher is the probability that they either (1)<br />

are not detected at all, an effect lowering the spectral responsivity towards long<br />

wavelengths, or (2) they are detected in neighboring pixels. This effect leads to an<br />

increased crosstalk for long wavelengths.<br />

On the other hand, for very short wavelengths, photons are already absorbed in the<br />

covering thin-film layers (passivation layers for scratch protection and inter-layer<br />

dielectrics, mostly <strong>of</strong> SiO2 or Si3N4 type) leading to a responsivity decrease towards<br />

blue and UV.<br />

Quantum efficiency<br />

In the framework <strong>of</strong> this dissertation we have also realized some test diodes in a<br />

0.5µm CMOS technology. The measured quantum efficiency curves for the<br />

classical n+ and n-well diodes (sketched in Figure 3.2) are summarized in<br />

Figure 3.5. Quantum efficiency is the ratio <strong>of</strong> the number <strong>of</strong> collected electron-hole<br />

pairs to the number <strong>of</strong> incoming photons, hence the efficiency <strong>with</strong> which optical<br />

radiation <strong>of</strong> a certain wavelength is converted into an electrical signal. In addition to<br />

the decrease in efficiency towards short wavelengths (UV) and long wavelengths<br />

(IR), one can observe interference peaks in the curves, which are caused by<br />

reflections in the thin-film structure on top <strong>of</strong> the semiconductor [PS2, SP4].

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