3D Time-of-flight distance measurement with custom - Universität ...
3D Time-of-flight distance measurement with custom - Universität ...
3D Time-of-flight distance measurement with custom - Universität ...
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SUMMARY AND PERSPECTIVE 181<br />
7. Summary and Perspective<br />
In this thesis we have presented the world’s first all-solid-state <strong>3D</strong> time-<strong>of</strong>-<strong>flight</strong><br />
range camera that is based on a <strong>custom</strong>ized photoASIC and does not require any<br />
mechanically moving parts. We achieve a <strong>distance</strong> resolution <strong>of</strong> a few centimeters<br />
over the range <strong>of</strong> several meters at a frame rate <strong>of</strong> 10 Hz for non-cooperative<br />
targets (reflectivity 0.7). The unambiguous <strong>distance</strong> range is 7.5 meters for 20 MHz<br />
modulation frequency and 20 meters for a modulation frequency <strong>of</strong> 7.5 MHz.<br />
We have given an overview <strong>of</strong> the existing range <strong>measurement</strong> techniques and<br />
compared them to the time-<strong>of</strong>-<strong>flight</strong> method. Optical interferometry mainly targets<br />
<strong>measurement</strong>s in the range <strong>of</strong> several centimeters, and is therefore not a real<br />
competitor in the 1-100 m range. The other popular ranging method, triangulation,<br />
either active or passive, suffers from shadowing effects and requires a large<br />
triangulation base and hence a large overall system size for good accuracy and<br />
<strong>distance</strong> range.<br />
Furthermore, we have described and compared the classical CCD image sensors<br />
<strong>with</strong> CMOS APS imagers, which have gained more and more importance in recent<br />
years. One <strong>of</strong> the “secrets” <strong>of</strong> this CMOS APS boom is that they can be fabricated<br />
<strong>with</strong> standard technologies that are steadily being miniaturized and improved,<br />
driven by the computer industry. This makes it possible to implement more and<br />
more functionality <strong>with</strong>in the sensor device and to realize more pixels on the same<br />
silicon area. From the existing range <strong>measurement</strong> techniques the time-<strong>of</strong>-<strong>flight</strong><br />
method benefits most from this development in the semiconductor industry. While<br />
all range <strong>measurement</strong> systems will more or less decrease in size (note:<br />
triangulation will always require a large triangulation base for good accuracy), the<br />
TOF method will additionally gain in <strong>measurement</strong> resolution. This is mainly<br />
because the miniaturization in integrated circuits in general also leads to faster,<br />
lower noise circuits and therefore improves the time- and thus <strong>distance</strong>-resolution<br />
<strong>of</strong> TOF systems. For these reasons and in view <strong>of</strong> the additional advantages (no