3D Time-of-flight distance measurement with custom - Universität ...
3D Time-of-flight distance measurement with custom - Universität ...
3D Time-of-flight distance measurement with custom - Universität ...
Create successful ePaper yourself
Turn your PDF publications into a flip-book with our unique Google optimized e-Paper software.
DEMODULATION PIXELS IN CMOS/CCD 145<br />
5.2.9 Summary<br />
The demodulation contrast depends on several parameters: amplitude <strong>of</strong> gate<br />
voltages, demodulation frequency, received optical power density and wavelength<br />
<strong>of</strong> modulated light. Since the CCD shutter mechanism used never has 100%<br />
efficiency, even under DC conditions, the demodulation contrast is never better<br />
than about 60%.<br />
The contrast decreases <strong>with</strong> higher modulation frequencies, since the<br />
photoelectrons do not have enough time to reach the storage site (dump site<br />
respectively). The gate voltages PGL and PGR should be chosen to be as high as<br />
possible. This is in order to generate high electrical fields in the semiconductor.<br />
Even for a voltage difference <strong>of</strong> 10 V between two adjacent photogates, the<br />
saturation velocity <strong>of</strong> electrons is not yet reached. Therefore, the experimentally<br />
measured optimum gate voltages <strong>of</strong> about 8 V are reasonable: an increase in<br />
electrical field still causes an increased drift velocity and hence faster response <strong>of</strong><br />
charge carriers to the electrical field. For modulation voltages higher than 8 V the<br />
maximum signal that can be handled decreases, since the charge handling<br />
capability <strong>of</strong> the pixel is essentially influenced by the potential difference between<br />
the modulation gate PGL and the integration gate IG (10.7 V).<br />
Furthermore, the demodulation contrast decreases <strong>with</strong> increasing wavelength.<br />
This is because the light penetrates deeper into the semiconductor before<br />
photoelectrons are generated. These photoelectrons then need more time to reach<br />
the depletion region, where they are separated to the dump- or integration site,<br />
depending on their arrival. Also photoelectrons generated far from the surface<br />
diffuse in random directions, so that they are equally likely to travel directly to the<br />
integration or dump site, independently <strong>of</strong> the actual biasing conditions <strong>of</strong> the<br />
modulated photogates PGL and PGR.<br />
For the BCCD realization <strong>of</strong> the 1-tap demodulation pixel we have measured a<br />
contrast <strong>of</strong> 40% using 20 MHz (more or less) sinusoidally modulated light <strong>of</strong> 630 nm<br />
wavelength. The SCCD performance is only slightly worse, so that the availability <strong>of</strong><br />
a buried channel process option is not necessarily needed. For lower modulation<br />
frequencies and blue light the contrast is better than 60%, quite close to the<br />
prediction <strong>of</strong> the simple model introduced in Figure 5.14. The contrast decrease<br />
towards higher modulation frequencies can at least partly be attributed to the more