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Research Directory of the Brandenburg University of Applied Sciences

Research Directory of the Brandenburg University of Applied Sciences

Research Directory of the Brandenburg University of Applied Sciences

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A typical <strong>the</strong>rmopile used as an IR<br />

sensor is shown in Fig. 3.22. It consists<br />

<strong>of</strong> 72 <strong>the</strong>rmocouples with one<br />

type <strong>of</strong> junction (“hot junction”) in<br />

<strong>the</strong> center <strong>of</strong> a thin micromachined<br />

Si 3 N 4 membrane and <strong>the</strong> o<strong>the</strong>r type<br />

(“cold junction”) connected to <strong>the</strong><br />

outside silicon substrate [8, 9]. The<br />

IR radiation must be absorbed on<br />

<strong>the</strong> <strong>the</strong>rmopile to be detected, so<br />

<strong>the</strong> center is coated with a absorption<br />

layer (500 μm diameter). The<br />

<strong>the</strong>rmogram <strong>of</strong> a homogeneous tempered<br />

<strong>the</strong>rmocouple depicts <strong>the</strong><br />

emissivity difference between <strong>the</strong> absorption layer and<br />

<strong>the</strong> surrounding sensor area, see Fig. 3.22. The absorption<br />

layer should define <strong>the</strong> radiation sensitive area. But<br />

<strong>the</strong> incident radiation is also partially absorbed on <strong>the</strong><br />

uncovered membrane area causing a contribution to a<br />

temperature increase <strong>of</strong> <strong>the</strong> membrane. Therefore <strong>the</strong><br />

sensor exhibits a larger radiation sensitive area as defined<br />

by <strong>the</strong> size <strong>of</strong> <strong>the</strong> absorption layer. This behavior <strong>of</strong><br />

an undefined radiation sensitive sensor area can cause<br />

a lot <strong>of</strong> problems in application <strong>of</strong> <strong>the</strong> sensors.<br />

Wissenschaftliche Beiträge – Fachbereich Technik<br />

Scientific Articles – Department <strong>of</strong> Engineering<br />

Fig. 3.23: Thermopile operated as a Peltier element with an electrical voltage applied to <strong>the</strong> <strong>the</strong>rmopile<br />

detector such that <strong>the</strong> <strong>the</strong>rmocouples in <strong>the</strong> center are heated (left). For comparison an<br />

image without applied voltage is shown (right).<br />

The Peltier effect represents <strong>the</strong> opposite effect to <strong>the</strong><br />

Seebeck effect and a <strong>the</strong>rmopile consequently represents<br />

a Peltier element if it is operated in <strong>the</strong> opposite<br />

way [10]. If a voltage is applied to <strong>the</strong> <strong>the</strong>rmopile one<br />

type <strong>of</strong> junctions is heated up and <strong>the</strong> o<strong>the</strong>r type <strong>of</strong> junctions<br />

is cooled down. The direction <strong>of</strong> <strong>the</strong> applied voltage<br />

determines what type is heated or cooled, respectively.<br />

Fig. 3.23 depicts such operation <strong>of</strong> <strong>the</strong> <strong>the</strong>rmopile.<br />

The used polarity <strong>of</strong> <strong>the</strong> applied voltage causes a hea-<br />

Fig. 3.24: Thermogram <strong>of</strong> a <strong>the</strong>rmopile operated as a<br />

Peltier element with heated <strong>the</strong>rmocouples in <strong>the</strong><br />

center (top, left). Comparison <strong>of</strong> <strong>the</strong> temperature line<br />

pr<strong>of</strong>ile <strong>of</strong> <strong>the</strong> center heated <strong>the</strong>rmopile (right, top a)<br />

with <strong>the</strong> 3D - sensitivity pr<strong>of</strong>ile <strong>of</strong> <strong>the</strong> <strong>the</strong>rmopile<br />

(right, top b) measured by a laser spot measurement<br />

(top, right). False color representation <strong>of</strong> <strong>the</strong> spatial<br />

sensitivity distribution with laser scanning (bottom,<br />

left) and <strong>of</strong> <strong>the</strong> temperature distribution due to <strong>the</strong><br />

Peltier effect with IR imaging (bottom right).<br />

Forschungsbericht <strong>Research</strong> Report 2007 – 2010 87

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