Research Directory of the Brandenburg University of Applied Sciences
Research Directory of the Brandenburg University of Applied Sciences
Research Directory of the Brandenburg University of Applied Sciences
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Summary<br />
Within <strong>the</strong> paper it was shown that high-end cameras<br />
<strong>of</strong>fering small integration times and microscope objective<br />
adaptation expand <strong>the</strong> possibilities <strong>of</strong> use <strong>of</strong> <strong>the</strong>rmal<br />
imaging in analyzing fast <strong>the</strong>rmal processes with<br />
an increased spatial resolution for R&D work.<br />
References<br />
[1] Möllmann, K.-P.; Lutz N.; Vollmer M., Wille, Ch;<br />
“Thermography <strong>of</strong> microsystems”; InfraMation 2004<br />
Proceedings, Vol. 5, p. 183 - 195<br />
[2] Holst, G.C.; “Testing and evaluation <strong>of</strong> infrared imaging<br />
systems”, JCD Publishing Co, Maitland, USA 1993<br />
[3] Holst, G.C.; “Common sense approach to <strong>the</strong>rmal<br />
imaging”, SPIE, Bellingham, USA 2000<br />
[4] Möllmann, K.-P; Karstädt, D.; Pinno, F. and Vollmer,<br />
M.; “Thermal image quality – visualization <strong>of</strong> spatial<br />
and <strong>the</strong>rmal resolution in <strong>the</strong>rmal imaging”; InfraMation<br />
2006 Proceedings, Vol. 7, p. 79 - 92<br />
[5] http://www.leister.com/axetris/<br />
Wissenschaftliche Beiträge – Fachbereich Technik<br />
Scientific Articles – Department <strong>of</strong> Engineering<br />
[6] Dereniak, E. L.; Boreman, G. D.; “Infrared detectors<br />
and systems”; John Wiley & Sons Inc. 1996<br />
[7] Seeger, K.; “Semiconductor Physics”, Springer<br />
Series in Solid State Science, Springer-Verlag New York<br />
Berlin Heidelberg 5th ed. 1991<br />
[8] http://www.ipht-jena.de/en/<br />
[9] Madou, M.; “Fundamentals <strong>of</strong> micr<strong>of</strong>abrication”;<br />
CRC Press Boca Raton London New York Washington,<br />
D.C.,1997<br />
[10] Rowe, D. M. (Ed.); “Thermoelectrics handbook:<br />
macro to nano”; CRC Press Boca Raton London New<br />
York Washington, D.C., 2005<br />
[11] Incropera, F. P., DeWitt, D. P.; “Fundamentals <strong>of</strong><br />
heat and mass transfer”; John Wiley &Sons 4th ed.<br />
1996<br />
[12] Möllmann, K.-P; Trull, T.; Mientus, R.; “Single-<br />
Mikrobolometer als Sensoren für Infrarotstrahlung Ergebnisse<br />
eines Kooperationsprojektes zur Technologieentwicklung”;<br />
Temperatur 2009; 24./25.06.2009;<br />
Berlin; Germany; ISBN 3-9810021-9-9<br />
[13] Hudson, R. D., Hudson, J. W. (Eds.); “Infrared Detectors”;<br />
Dowden, Hutchinson, and Ross, Wiley (1975)<br />
Forschungsbericht <strong>Research</strong> Report 2007 – 2010 91