Scan Tool Operating Instructions - AK Automotive Training

Blink Codes Instructions
Manufacturer Applications
Select either 2-digit or 3-digit slow code reader from the menu according to the type
listed in the application list for the vehicle under test.
While the application is reading, the tester emits sounds.
The tick sound indicates that the application is running and functioning and the beep
sounds when a code is being received from the system under test.
There is no live data facility available with slow code systems.
Turning the ignition off and on resets the system for the next test so the user is
required to follow the OmiCheck instructions in order to determine when these
operations should be performed.
NOTES:
• Fault codes reported by this application do not necessarily indicate a faulty
component or system, Some fault codes may be for components or systems not
fitted to the vehicle.
• A fault may also be reported if the test has not been performed correctly.
• A fault for a component may indicate a fault wiring circuit. The wiring to the
component must be completely checked before components are changed.
• All peripheral items must be switched off at the start of the test e.g. heater fans and
air conditioning.
Printing the Results (OmiCheck only)
Each test prompts the user when printing is available. Refer to the printer instruction
for connection to the OmiCheck.
• A header is printed when the application is requested to print for the first time
during a test. It is recommended that the printout is not removed until all tests have
been performed as there will not be a header output for further tests until the
OmiCheck is reset.
3-Digit Systems
All the tests are routines performed by the vehicle with either the engine running or
with the ignition only on. Therefore to get clear codes, actuator tests or wiggle tests,
the application initiates the KO EO or KO ER tests.
Fault codes are output during the KO EO and KO ER test.
There are two types of fault output by the vehicle. The first are current faults that are
present at the time of test and KAM (Keep Alive Memory) which are faults recorded
in the memory and may be present or have occurred and are now absent.
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