Tecnai on-line help manual -- Options - UT Southwestern
Tecnai on-line help manual -- Options - UT Southwestern
Tecnai on-line help manual -- Options - UT Southwestern
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<str<strong>on</strong>g>Tecnai</str<strong>on</strong>g> <strong>on</strong>-<strong>line</strong> <strong>help</strong> Opti<strong>on</strong>s 121Opti<strong>on</strong>s Software versi<strong>on</strong> 2The following procedure is used:• Direct cross-grating calibrati<strong>on</strong> of a lower HM-STEM magnificati<strong>on</strong> (not necessarily the lowermostbecause this may be too low to resolve the grating squares effectively). If the image distorti<strong>on</strong> is toohigh, the software will automatically adjust the distorti<strong>on</strong>s in an iterative procedure until the distorti<strong>on</strong>sare less than 0.1% (vector lengths of the grating square dimensi<strong>on</strong>s) and 0.1° (angle betweenvectors).• Direct cross-grating calibrati<strong>on</strong> of a comparable Microprobe STEM magnificati<strong>on</strong>. If the imagedistorti<strong>on</strong> is too high, <strong>on</strong>ce again the software will automatically adjust the distorti<strong>on</strong>s in an iterativeprocedure until the distorti<strong>on</strong>s are less than 0.1% (vector lengths of the grating square dimensi<strong>on</strong>s)and 0.1° (angle between vectors).These STEM calibrati<strong>on</strong> procedure will be run for a total STEM rotati<strong>on</strong> angle of 0°. This means that thefree (user) STEM rotati<strong>on</strong> is set to 0°, and the aligned value (which corrects for the mismatch betweenstage axes and STEM image axes) is also temporarily set to 0° (the latter value is reset at the end of theprocedure to the starting value). Effectively this means that the smallest distorti<strong>on</strong>s and most accuratemagnificati<strong>on</strong>s are achieved at the same STEM rotati<strong>on</strong> angle.Note: Both types of STEM-mode magnificati<strong>on</strong>s are str<strong>on</strong>gly dependent <strong>on</strong> the pivot points,perpendicular correcti<strong>on</strong>s and distorti<strong>on</strong> adjustment. For STEM magnificati<strong>on</strong>s as accurate as possible,the same STEM settings should be used as during the calibrati<strong>on</strong>. It is therefore advised to adjust thepivot points and perpendicular correcti<strong>on</strong>s carefully before the calibrati<strong>on</strong> and store these settings in analignment file (after the calibrati<strong>on</strong>, because that may have included adjustment of the STEM distorti<strong>on</strong>)and having users always use those alignments. If the STEM distorti<strong>on</strong>s initially were a l<strong>on</strong>g way off, stopthe procedure after the distorti<strong>on</strong> adjustment and check the pivot points and perpendicular correcti<strong>on</strong>s,and then restart the procedure.The Microprobe STEM magnificati<strong>on</strong> calibrati<strong>on</strong> does not result in a calibrati<strong>on</strong> file. The calibrati<strong>on</strong> valuefor the Microprobe STEM magnificati<strong>on</strong> is directly set to the <str<strong>on</strong>g>Tecnai</str<strong>on</strong>g> software and also entered as acalibrati<strong>on</strong> value in the system branch of the microscope settings in the registry.9.1.7 Measurement <strong>on</strong> cross-gratingThe magnificati<strong>on</strong> calibrati<strong>on</strong> is d<strong>on</strong>e <strong>on</strong> the basis of a standard specimen, a cross-grating. Thisspecimen has squares <strong>on</strong> it with a spacing of 463 nm. The software will acquire an image of the crossgratingand analyse that to find the basic spacing. The analysis is d<strong>on</strong>e either using an auto-correlati<strong>on</strong>or an FFT (at high and low magnificati<strong>on</strong>s, respectively) in which the two basic vectors will be out<strong>line</strong>d bycircles. Additi<strong>on</strong>al circles may be present further away from the center to show the positi<strong>on</strong> of themultiple of the base vector that is actually used for further refinement of the measurement.